IEEE Dayton Section

Dayton Section founded June 1943 * Sponsor of NAECON

Home

Officers
Chair's Corner
PACE Activities
Student Activities
Consultants Network

Chapters
AESS
APS/MTT
Computer Society
Photonics Society
SMCS & EMBS
Signal Processing

Conferences
NAECON
ESubscriptions
Member Honors
Memoriums

Webmaster

 

 

Tip of the day:

Happy 70th Birthday IEEE Dayton


IEEE PACE Event Professional Activities Committee for Engineers

Friday 19 July 2013

Trusted Microelectronics & Community of Practice


Senior Member Event

19 July

Interested in becoming a Senior Member? We will once again be hosting a Senior Member event on 19 July as part of the IEEE Dayton section PACE event. This event will help eligible* IEEE members in the Dayton Section apply for IEEE Senior Member-ship. For more infor-mation on the event con-tract: cdeardorf@ieee.org

*For information on Senior Member eligibility and requirements visit:
http://www.ieee.org/membership_services/membership/senior/index.html

Miami Valley Consultants Network

Friday, April 12 at 11:30,

at the Engineers Club
Please make reservations at 937-228-2148


Patent Law Change Seminar Handouts

patent

Patent Basics and New Patent Developments under the America Invents Act

Steve Elleman Mark Levy Thompson Hine LLP

download

Join us at

apsIEEE APS Distinguished Lecturer Program (DLP) presents

Characterization of Space Shuttle Ascent Debris Based on Radar Scattering and Ballistic Properties - Evolution of the NASA Debris Radar (NDR) System

kentSPEAKER: Dr. Brian M Kent, Fellow of IEEE,AMTA, & AFRL; Chief Scientist, AFRL Sensors Directorate

Thurs May 23, 2013, 3-4 PM


WHERE: Tec^Edge, 5000 Springfield Street, suite 100, Dayton, Ohio 45431; 937.424.8661 (see monitors that will direct you to the room)

nasaABSTRACT: This is a presentation (with optional break) that introduces The NASA Debris Radar (NDR) system developed to characterize debris liberated by the space shuttle (and any follow-on rocket system) during its ascent Into space. Radar technology is well suited for characterizing shuttle Ascent debris, and is especially valuable during night launches when optical sensors are severely degraded. The shuttle debris mission presents challenging radar requirements in terms of target detection and tracking, minimum detectable radar cross-section (RCS), calibration accu-racy, power profile management, and operational readiness. After setting the stage with background of the Columbia accident, I initially describe the NDR system consists of stationary C-band radar located at Kennedy Space Center (KSC) and two X-band radars deployed to sea during shuttle mis-sions. To better understand the signature of the shuttle stack, Xpatch cal-culations were generated at C and X band to predict the radar signature as a function of launch time. These calculations agreed very well with meas-ured data later collected.


Various sizes, shapes, and types of shuttle debris materials were characterized using static and dy-namic radar measurements and ballistic coefficient calculations. After an (Optional) break, my second Part discusses the NASA Debris Radar (NDR) suc-cesses, which led to a new challenge of processing and analyzing the large amount of radar data col-lected by the NDR systems and extracting infor-mation useful to the NASA debris community.
Analysis tools and software codes were developed to visualize the shuttle metric data in real-time, visualize metric and sig-nature data during post-mission analysis, automatically detect and characterize de-bris tracks in signature data, determine ballistic numbers for detected debris ob-jects, and assess material type, size, re-lease location and threat to the orbiter based on radar scattering & ballistic properties of the debris. Future applications for space situational awareness and space-lift applications will also be discussed.

BIO: Dr. Brian M. Kent, a member of the scientific and professional cadre of senior executives, is Chief Scientist, Sensors Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Ohio. He serves as the directorate's principal scientific & technical adviser and primary authority for the technical content of the science & technology portfolio. He evaluates the total laboratory tech-nical research program to determine its adequacy and efficiency in meeting national, Department of Defense, Air Force, Air Force Materiel Command and AFRL objectives in core technical competency areas. He identifies research gaps and analyzes ad-vancements in a broad variety of scientific fields to advise on their impact on laboratory programs and objectives. He recommends new initiatives and ad-justments to current programs required to meet current and future Air Force needs. As such, he is an internationally recognized scientific expert, and provides authoritarian counsel and advice to AFRL management and the professional staff as well as to other government organizations. He also collaborates on numerous interdisciplinary research prob-lems that encompass multiple AFRL directorates, customers from other DOD components, as well as the manned space program managed by NASA. Dr. Kent joined the Air Force Avionics Laboratory in 1976 as cooperative engineering student through Michigan State University. He began his career per-forming research in avionics, digital flight displays and radar signature measurements. Through a ca-reer broadening engineering assignment with the Directorate of Engineering, Aero-nautical Systems Division, he modeled a number of foreign threat missile systems and performed offensive and defensive electronic combat systems assessments. He received a National Science Foundation Fellowship in 1979, working at both the Air Force Wright Aeronautical Laboratories and the OSU ElectroScience Laboratory until the comple-tion of his doctorate. Dr. Kent spent two years in the Passive Observables Branch of the Avionics Labora-tory, later transferring to the AFWAL Signature Technology Office. From 1985 to 1992, Dr. Kent was involved with classified research efforts, managed through the Air Force Wright Laboratory, now AFRL.
During his tenure with AFRL and its predecessor or-ganizations, Dr. Kent held a variety of positions. He has made pioneering and lasting contributions to the areas of signature measurement technology, and successfully established international standards for performing radar signature testing. Dr. Kent has authored and co-authored more than 85 archival articles and technical reports and has written key sections of classified textbooks and design manuals. He has delivered more than 200 lectures, and devel-oped a Special DOD Low Observables Short Course that has been taught to more than 2,000 scientists and engineers since its inception in 1989. Dr. Kent has provided technical advice & counsel to a wide range of federal agencies, Including the Department of Transportation, the Department of Justice and NASA's Space Shuttle Program. He is also an interna-tional technical adviser for the DOD & has provided basic research guidance to leading academic institutions.

Take an Online Learning Course 

IEEE Computer Society members will now have free access to a new platform containing hundreds of TechLeader OnLine courses, books, and certifications as part of their membership. Organized into 16 KnowledgeCenters, the courses enlist video, audio, mentoring, and other fresh educational approaches as tools to increase engagement and interaction

Knowledge Centers covering technical skills are:

  • IT Security
  • DoD Directive 8570.1 ·
  • Java
  • Cisco
  • Oracle
  • MCSE/MCSA
  • Microsoft Enterprise
  • Microsoft Office 2010
  • Six Sigma
  • Visual Basic
  • Visual C#

The Knowledge Centers covering professional skills are:

  • Leadership
  • Management
  • Project Management
  • Professional Foundations
  • Call Centers

The books and courses will be updated throughout the year. To become a Computer Society member, visit www.computer.org/join. To access online member resources, go to http://www.computer.org/e-learning.

 

IEEE Dayton T-Shirt Order Form

NAME:___________________________
IEEE Member ID: ________________
QTY Size(S-XL) ____ x $15 = ____
QTY Size(2XL+) ____ x $16 = ____
TOTALS QTY ____ COST $____
*Active members receive a $2 discount per shirt*

All orders must be received by 28 September

Orders must be submitted via email to Joseph.Natarian@ieee.org
Checks payable to IEEE Dayton, and delivered to: IEEE Dayton
c/o 1242 Rustic Creek Drive, Dayton, OH 45458 Shirts will be available for pickup October 17th 2012.

WE NEED YOUR IDEAS FOR
2013 PACE EVENTS!

Recent IEEE Dayton Section PACE Events included 2012 Student Paper Contest, 2012 Chairman's Reception, and Senior Member Drive. Help us plan new events. Read more

Upgrade to Senior Membership

IEEE will be pleased to send a notification to your employer. http://www.ieee.org/membership_services/membership/senior/

Be sure to use to encourage someone to join IEEE with one of three coupons for $25 off a new membership. These coupons are included with your new IEEE membership card and they expire in the calendar year that Senior Membership is received. Use them before they expire on Dec 31, 2012! https://www.ieee.org/membership_services/membership/join/

Finally, as a new Senior Member, you are now positioned to provide a reference for qualified Senior Member candidates. Consider nominating a member today. Your nomination will count as one of the three required references. If you list "IEEE Dayton Section" as the "Nominating Entity" on the "Application Info" tab, the IEEE Dayton Section will earn $10 when the member is elevated to Senior Membership. https://www.ieee.org/membership_services/membership/senior/application/

Check Out Photos from the

10th Annual Dayton / Miami Valley TechFest™

 

 

Copyright 2012

| Home | Contact the Webmaster | Webmaster Lida Ray Technologies | Privacy |