While the vast majority of optical techniques, measurements, and technology create, use, and detect light in large quantities, there is growing interest in single-photon technology for a wide range of applications. These applications include, among others, high sensitivity chemical analysis, quantum information, and even high-speed communication with Mars. Along with this growth in interest is a fast growing toolbox of single-photon technology being developed, which in turn is bringing with it single-photon metrology needs. We present an overview of single photon technology and metrology efforts by our group and others.
Alan Migdall received his PhD in physics from MIT and BS in mathematics and physics from U. of Maryland. He is a member of the Optical Technology Division at NIST, where he is involved in projects that use two-photon light sources and their entanglement for absolute metrology and quantum information applications. Traditionally these two-photon light sources have relied on parametric downconversion in bulk crystals, but efforts are moving toward using higher order nonlinearities made possible by new types of optical fibers. In the area of metrology, current work is underway to determine the ultimate uncertainty limits of the two-photon measurement method for both photon counting detector efficiency and spectral source radiance measurements. In quantum information, efforts include the development and characterization of improved single photon sources and high photon number entanglement, as well as the encouragement of related single-photon component technology. Previous work included the laser cooling of atoms, which resulted in the first trapping of a neutral atom. As a means of encouraging single photon technology, Migdall has organized a number of workshops, symposiums, and special issues on the topic.
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