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The event will be held at bps Training and Conference Center
To register for this event, please submit the online Registration form - Pick "Chapter VIII - EMC" from the registration form menu.
There will be ~seven concurrent technical presentations of interest to electrical engineers to choose from.
For more information on the IEEE Section Meeting, please visit the webpage at https://www.ieee-sem.org/?q=node/view/59
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Schedule of Events 5:00 - Registration Begins 5:45 - Chapter Presentations begin 6:45 - Break / Student Exhibit time 7:15 - Dinner 8:15 - Keynote Address 9:00 - End
To be added or removed from the IEEE EMC e-mailing list, send email to s.r.lytle@ieee.org with ADD or REMOVE in subject line.
The IEEE Southeastern Michigan EMC Homepage is https://www.emcsociety.org
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Synopsis of Presentation
Abstract:
Radiated
Immunity Test Considerations
Several contemporary
radiated immunity test issues facing today's EMC engineer will be discussed
including calibration of microwave pulses, solid state vs. TWT and spot size
vs. gain. The problem of harmonics and low gain antennas will also be discussed
Biographical Sketch
Tom Hahn is Senior Application Engineer at Amplifier Research. He has 20 years
of prior electrical test and applications engineering and management experience
at AT&T Bell Laboratories, Lucent Technologies, and Agere Systems. Tom holds
a B.S. degree in electrical engineering and physics from Lafayette College.
The IEEE Southeastern Michigan EMC Homepage is https://www.emcsociety.org