Li-C. Wang is professor of ECE department at UC-Santa Barbara. He received Ph.D. in 1996 from University of Texas at Austin. He was a senior CAD software technical staff member at Somerset PowerPC Design Center, Motorola from 1996 to 2000, where he led various projects for PowerPC microprocessor test and verification. Dr. Wang received best paper awards from DATE-1998, IEEE VTS-1999, and DATE-2003. He is the recipient of the Technical Excellence Award from Semiconductor Research Cooperation (SRC) in 2010 for his contribution on developing data mining technologies in the areas of test and validation. He co-founded the IEEE Microprocessor Test and Verification (MTV) Workshop, and is currently the program co-chair. He is currently serving or had served as technical PC member for various workshops and conferences including ITC, VTS, ICCAD, DATE, DAC, ISQED, HLDVT, ITSW, DATA, ATS, ICCD, VLSI-DAT, etc and is currently serving as the general co-chair for VLSI-DAT. He is an associate editor of IEEE Trans. on CAD and also guest editors of a number of D&T special issues. From 2005, his research group has published more than 60 papers on the topics of applying data mining and machine learning in test, verification and validation.