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The
Seventh Annual IEEE Workshop on Microelectronics and Electron Devices
will provide a forum for reviewing and discussing all aspects of
microelectronics including processing, electrical characterization,
design and new device technologies. This symposium will consist of
both invited and contributed talks and papers as well as a poster
session throughout the afternoon. Faculty, students, and researchers
in industry are encouraged to contribute presentations on either
completed research or “work-in-progress” research. Topics are in the
following areas that will form the contributing sessions and poster
sessions in the workshop program:
Microelectronic
Device Processing and Process Integration
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Trends in submicron
technologies; product development (DRAM, SRAM, Flash, CMOS Imagers);
new device technologies (Phase Change Memory, Resistive Memory,
Ferroelectric Memory, Nano-electronics), novel transistors, device
improvements.
Microelectronic Device Electrical and
Reliability Testing
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Dielectric reliability;
device reliability; phase change memory reliability; novel memory
technology testing schemes; electrical properties of novel devices.
Semiconductor Packaging and Reliability
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Semiconductor package
reliability, Design for Manufacturability, and stacked die packaging,
and novel assembly processes. Novel packaging structures, processes,
and materials.
Microelectromechanical Systems (MEMS) and
Nanoelectronic Devices
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Novel processes and
materials, MEMS research, development and performance; nanotubes,
nanowires, quantum dots, molecular devices, device characterization
for nanoelectronic devices.
Microelectronic Circuit Design
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New product design,
design techniques, and memory sensing schemes.
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