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WMED-2010 Call For Papers |
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Special Note for International Authors If you require a The Eighth Annual IEEE Workshop on Microelectronics and Electron Devices
will provide a forum for reviewing and discussing all aspects of
microelectronics including processing, electrical characterization, design
and new device technologies. This symposium will consist of both invited and
contributed talks and papers as well as a poster session throughout the
afternoon. Faculty, students, and researchers in industry are encouraged to
contribute presentations on either completed research or “work-in-progress”
research. Topics are in the following areas that will form the contributing
sessions and poster sessions in the workshop program: Microelectronic Device Processing and
Process Integration ·
Trends in submicron technologies; product development ( MEMS and Nanoelectronic Devices ·
Novel processes
and materials, MEMS research, development and performance; nanotubes, nanowires, quantum dots,
molecular devices, device characterization for nanoelectronic
devices. Microelectronic Device Electrical and Reliability Testing ·
Dielectric reliability; device reliability; phase change memory
reliability; novel memory technology testing schemes; electrical properties
of novel devices. Semiconductor Packaging and Reliability ·
Semiconductor package reliability, Design for Manufacturability, and
stacked die packaging, and novel assembly processes. Novel packaging
structures, processes, materials research, development, and performance. Microelectronic Circuit Design ·
New product design, design techniques, and memory sensing schemes. Please submit
your IEEE-formatted (up to four pages) manuscript by January 25th, 2010 to: All accepted manuscripts will be indexed
in the Manuscript
Review Process Since the
accepted manuscripts will be published as an IEEE publication, a rigorous
peer-review process will be installed to meet the IEEE criterion for minimum
standards of quality. All submissions
will be rated by the technical committee based on the following standard
criteria: ·
Originality of
the Work ·
Significance and
technological importance ·
Quality of
data/results and its interpretation ·
Completeness of
the manuscript ·
Reference of the
Work of Others ·
Organization of
the Manuscript ·
Literary quality
(clarity in Writing, figures, tables, etc.) Authors of all
accepted manuscripts will have an opportunity to present their work in one of
the contributed sessions. If a
manuscript is not accepted for publication, it will be automatically
considered for the poster session. Note for Authors: The WMED organizing committee reserves the right to exclude a
paper from distribution after the conference (e.g. remove it from Questions
concerning the paper content or submission process can be directed to:
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This workshop is
receiving technical co-sponsorship support from the IEEE Electron Devices
Society. |
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