The atomic force microscope (AFM) and its many scanning force techniques are becoming increasingly important for the characterization and fabrication of nanomaterials, thus contributing to the general development of nanotechnology. At the heart of the AFM is the interaction between the scanning probe tip and sample substrate. The unique mechanical properties and nanometer scale diameter of carbon nanotubes (CNT) render CNT ideal as scanning probe tips. This presentation briefly reviews the various techniques for fabricating both single-walled and multi-walled CNT AFM tips, and some of the technical challenges facing these fabricating methods. Our unique fabrication technique produces very robust multi-walled carbon nanotube tips with a high aspect ratio (>1 μm length and 10-20 nm diameter). In addition, a novel and simple tip sharpening technique has been developed to reduce the radius of curvature of the multi-walled carbon nanotube tips (radius < 5 nm). As the result, we now have highly robust carbon nanotube tips with the capability of imaging high aspect ratio features and higher lateral resolution. Data demonstrating the applications of the nanotube tips in a number of different scanning probe techniques, such as magnetic force, chemical force, semiconductor metrology, and liquid imaging of biopolymers will be presented. The carbon nanotube tips are electrically conductive so they are also ideal for application in scanning probe lithography (SPL). SPL, operated by passing an electrical current between the CNT tip and substrates while scanning, can form chemically patterned surfaces with nanometer accuracy. Subsequently, SPL with a nanotube tip offers a high resolution and precise means for nanomaterial deposition and opens up many possibilities for device fabrication. Data demonstrating SPL with CNT probes will also be presented.