Abstract  
Variation Robustness for Analog/Mixed-Signal, Custom Digital and Memory Design Patrick G. Drennan, Ph.D. Chief Technology Officer Solido Design Automation As process technologies and supply voltages shrink, designers are faced with a pressing need to address systematic and random sources of variation in a more deliberate and thorough way. Accounting for variation within the flow of design has not progressed commensurate with the process technologies. We still rely on best-, worst- case corners, mismatch plots and maybe a Monte Carlo verification if there is enough time. It is time for a new approach. This talk will begin with a brief review of the physical phenomena and industry standard device models for variation sources, including random local and global variations and systematic proximity effects. New techniques to accelerate, increase accuracy and derive more information from statistical variation analysis will be presented.