SREEJIT CHAKRAVARTY

Dr. Sreejit Chakravarty completed his BE in electrical and electronics engineering from BITS, Pilani, India (BS), and the MS and PhD in Computer Science from the State University of New York respectively in 1980, 1983 and 1986. After that he spent about 11 years in academia as an Associate Professor of Computer Science at the State University of New York at Buffalo. Since 1997 he has been with Intel Corporation where he is a Principal Engineer in the Advanced Test Technology group. He is the technical lead in various test technology projects targeted at Intel's microprocessor products, including defect based testing, scan-based at-speed testing etc. Dr. Chakravarty has published widely in various IEEE journals and conferences, has several patents and has co-authored a book on IDDQ Testing. He served as General Chair, Program Chair and Program Vice-Chair of several IEEE conferences/symposias. He continues to serve on the program and organizing committees of several IEEE conferences. He has delivered several keynote addresses at IEEE sponsored conferences. Sreejit is a fellow of IEEE.