Upcoming Event:

Date: Thursday, December 8, 2011

6:00pm: Refreshments & Social Hour
6:30pm: Technical Presentation
8:00pm: Adjourn
RSVP: brian.lee@ieee.org

Location: Agilent Technologies Main Building Aristotle Room-- the large conference room in the Main Lobby 5301 Stevens Creek BLVD Santa Clara, CA 95054

Title

Miniature Frequency-Extension Modules for Vector Network Analyzers

Speaker

Dr. Karam Noujeim, Fellow Researcher, Anritsu Company

Abstract

A detailed description of the high-frequency reflectometer technology deployed in Anritsu's Vector Network Analyzer (VNA) family will be given. It will be shown that scaling of this technology for use in the millimeter-wave range results in miniature frequency-extension modules that provide unique capabilities such as direct connection to wafer probes, dense multi-port measurements, test-port power leveling, enhanced raw directivity, and reduced measurement complexity when compared with existing solutions. These capabilities, combined with the frequency-scalable nature of the extension modules provide users with unique and compelling solutions for their current and future high-frequency measurement needs. Applications of this technology beyond traditional test and measurement will be described.

Biography

Karam M. Noujeim received the M. Eng.-I degree from McGill University, Montreal, QC, Canada, in 1990, and the M. A. Sc. and Ph.D. degrees from the University of Toronto, Toronto, ON, Canada in 1994 and 1998. From January 1990 to September 1992, he was a Member of the Scientific Staff with Bell-Northern Research (Nortel), Ottawa, ON, Canada, where he was involved with the development of computer-aided design (CAD) tools for assessing the susceptibility of printed-circuit boards to electromagnetic interference. From August 1998 to June 1999, he was a Senior Member of the Technical Staff with Stellex Microwave Systems (a divestiture of the Watkins-Johnson Company), Palo Alto, CA, where he was involved in the development of millimeter-wave components for LMDS. In June 1999, he joined the Microwave Measurements Division, Anritsu Company, Morgan Hill, CA, as a Senior Microwave Design Engineer and is currently a Fellow Engineer. From June to December 2001, he was a Visiting Academic Researcher with the High-Frequency Electronics Laboratory, University of California at Santa Barbara, where he was involved with the design, fabrication, and testing of GaAs circuits based on nonlinear transmission lines. From August 2003 to December 2004, he designed and led the prototyping of high-sensitivity micromachined thermal power sensors at the Stanford Nanofabrication Facility (SNF), Stanford, CA. He holds several patents. His current areas of interest include traveling-wave structures for use in millimeter-wave harmonic generation, sampling, reflectometry, and beam-scanning antennas; miniature frequency extenders for spectrum and vector network analyzers; high-sensitivity sensors for millimeter-wave power measurements and automotive-radar testing; and high-speed signal integrity. Dr. Noujeim is a member of the IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES Editorial Review Board, and an occasional reviewer for the IEEE Microwave Magazine and ARFTG.