SCV-IMS

2002 Events:

Note: The presentations are available for browsing and downloading at each linked subject title.

December 18, 2002: "HOW TO MAKE DUMB SENSORS SMART - Fiber Optic and Microchip Sensors in Smart Structures" by Dr. Veljko Milanovic, President and Microsystems Engineer, Adriatic Research Insititue

Abstract: This talk will provide an introduction to the emerging field of Microelectromechanical Systems (MEMS) as it applies to optical applications. A variety of optical elements are batch-fabricated and/or assebmbled on-chip with circuits, other microsensors as well as with microactuators to form integrated functional systems. Applications such as telecommunications switches, chip-to-chip communication, sensor networks, and many others are expected to be significantly affected and in some cases enabled by the developments in this field.

MEMS technology is highly attractive for commercial applications, since it leverages the integrated circuit infrastructure, which enables high volume production of microsystem components at a low manufacturing cost. This new choice in manufacturing technology will result in high throughput devices that are lighter, more efficient, and are easier and less expensive to produce.

At ARI, we have been developing new methodologies to provide vertical actuation and rotation from lateral, in-plane actuation. Using this concept, we have been developing dual-axis micromirrors (MEMS scanners), micromirror arrays, and other components, and have aimed to provide optical wireless communication capability for a variety of sensors.

Realization of the proposed concept requires selective, high aspect ratio multi-level etching of silicon substrate, suing the so-called deep reactive ion etch (DRIE). In addition, wafer bonding and wafer-scale transfer technologies have become a very important part of the thrust for low-voltage, reliable and high-performance microoptical systems.

Biography: Dr. Veljko Milanovicis postdoctoral researcher (B.S. 1994, M.S.E.E. 1996, D.Sc. Microelectronics 1998 from the George Washington University). Founded and currently heads the Adriatic Reseach Institute (http://www.adriaticresearch.org), a non-profit scientific and education organiztion in Berkeley, CA. He is performing research in the area of design and microfabrication of microelectromechanical systems (MEMS), as well as in the area of RF network analysis of biological samples at the University of California at Berkeley.


November 20, 2002: "A Dream-Made-Real Test and Calibration Software for Electronic Test Market" by Jon Sigler, Agilent Technologies

Abstract: There are a great many software products for the ATE or electronic test market. Graphical test development environments (like Agilent VEE and National Instruments LabView) help speed test development. Test executives and sequencers exist (TestStand, TestExecSL) that allow users to create and reuse "component zed" measurements. Software toolkits try to bridge the gap between these components and the rest of the business.

But even when highly integrated the outcome of effort that use these elements is unsatisfactory. Often this effort must be bolstered by a great deal of custom programming and manual processes. Test development and maintenance costs are too great...but not because of the test development itself. It is about making these systems work within and for the business that is expensive. The test software industry has focused on test development and paid little attention to the larger business issues. As a result, tests, test stations and test results exist as technological islands inside highly integrated businesses.

So, what does business need from modern test systems? The need to integrate test systems into the business...or at least more readily integrated into the business is real. Users of test software want immediate access to data, track products through manufacturing, integrate quality tracking and document systems into test, deal with test versioning, contract manufacturing, co-manufacturing and still satisfy ISO requirements. Test developers require faster test development, shorter start up times, greater flexibility and much greater extensibility. Lack of connectivity, limited extensibility and outdated (or non-existent) data transport systems hobbles or limits a great many test software packages. This presentation offers ideas into how these problems might be resolved.

Biography: Jon Sigler spent my early years in Navy and Marine Corps calibration labs. After service Jon Sigler went to college and graduated from Memphis State with a BSEE. He subsequently went to work for Agilent (formerly Hewlett-Packard) in Spokane Washington. After about 5 years he moved (with Agilent) to Santa Rosa California. He's worked for Agilent for 20+ years in as an Electrical Engineer, Software Engineer and Manager. He's worked on a variety of software and firmware projects in the past 15 years. Most of his work has been associated software test systems and diagnostics.


October 16, 2002: "HOW TO MAKE DUMB SENSORS SMART - Fiber Optic and Microchip Sensors in Smart Structures" by Prof. George S. Springer, Department of Aeronautics and Astronautics, Stanford University

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Biography:


March 14, 2002: "Emerging Issues in Nanotechnologies" by Prof. Arun Majumdar, UC Berkeley

Abstract:

Biography: Professor Majumdar is currently teaching in the department of Mechanical Engineering of the University of California at Berkeley. Last year he receives the ASME Gustus Larson Memorial Award for Outstanding Achievements. He is member of the ASME, AAAS, and MRS. Professor Majumdar holds several key positions in the professional societies, i.e. Chair of Advisory Board, ASME Nanotechnology Institute and Chair of DOE Nanoengineering Workshop. He is involved in the work and strategical planning with nanoscale engineering and nanosystem. His current research interests are in the areas of Nanoscale Diagnostics (Scanning Probe Microscopy); Energy Conversion and Transport in Nanostructures; Optomechanical Microdevices; Nano-Biomolecular Engineering. In this workshop, he will share his view of the emerging issues in the nanotechnologies. To see his recent work, please visit the following web page. http://www.nano.me.berkeley.edu/