The San Francisco Bay Area chapter of the IEEE Power Electronics Society (IEEE SFBAC-PELS) is interested in the development of power electronics technology. This technology encompasses the effective use of electronic components, the application of circuit theory and design techniques, and the development of analytical tools toward efficient electronic conversion, control, and conditioning of electric power.

SFBAC PELS is the winner of three awards in 2017: PELS Best Chapter, Region 6 Outstanding Chapter, and SCV Section Outstanding Chapter.


Reliability of a Semiconductor Power Switch in a Power Electronics Switching Converter
San Francisco Bay Area PELS Chapter and co-sponsored by the Santa Clara Valley Reliability Society

Prof. Krishna Shenai

Wednesday, July 25, 2018
6:30pm - 7:00pm: Dinner and Networking
7:00pm - 8:00pm: Talk and Q & A

Texas Instruments
Building E Conference Center
2900 Semiconductor Blvd.
Santa Clara, CA 95051

Registration Required!

Admission: $5 cash at the door. Students and TI'ers: Free (limit 10 people)

Special thanks to Venue Sponsor Texas Instruments


The reliability of a semiconductor power switch in a power electronics converter is perhaps one of the least understood topics today. It is well known that the power switches experience extreme electrical and thermal stresses in power converters. However, today’s design methodologies of power electronics switching converters do not account for performance degradation of circuit components and thermal management system with aging. As a result, design of a power converter with a prescribed mean-time-between-failure (MTBF) is not possible.

This talk will discuss the current state-of-the-art in this critical area and propose improvements needed for the development of high-density power converters employing advanced silicon and wide bandgap (WBG) semiconductor power switching devices.

The talk will cover the following topics:

  • Current methodology used for power converter design
  • Current approaches used in assessing power semiconductor switch reliability
  • Case study: Field-reliability of a high-density computer power supply - lessons learned
  • Silicon vs. Wide Bandgap Power Devices (GaN and SiC)
  • Moving Forward: What do we need to do in order to be able to design a power converter with "built-in" field-reliability?
About the Speaker:

Krishna Shenai is a Senior Fellow at the Computation Institute, University of Chicago, Chicago, Illinois (USA) and an Adjunct Professor of electrical engineering and computer science at Northwestern University, Evanston, Illinois (USA). He earned his PhD degree in electrical engineering from Stanford University, Stanford, CA in 1986. For nearly 40 years, Dr. Shenai has pioneered and made seminal contributions to the development and manufacturing of power semiconductor materials and devices, and power converters and power amplifiers.

He is a Fellow of IEEE, a Fellow of APS, a Fellow of AAAS, a Fellow of IETE-India, and a member of the Serbian Academy of Engineering. Dr. Shenai has authored or co-authored more than 450 peer-reviewed archival papers and 10 book chapters; edited twelve conference digests; authored three books; and, is a named inventor in 13 issued US patents. He was the Editor of IEEE Trans. Electron Devices (1990-2000), founding Editor-in-Chief (EIC) of IEEE Electron Devices Society Newsletter (1994-2002), and served as the invited guest editor for two Special Issues of IEEE Trans. Electron Devices and two Special Issues of IEEE J. Solid-State Circuits. Currently, he serves as an editor of IEEE J. Electron Devices Society (JEDS) and as Distinguished Lecturer of both IEEE Electron Devices Society (EDS) and IEEE Power Electronics Society (PELS).

Congratulations to the SFBAC-PELS Chapter!

2017 Worldwide PELS Best Chapter Award

2017 Region 6 Outstanding Chapter

2017 SCV Section Outstanding Chapter