Seminar Announcement
These events are organized by various sub-sets of the IEEE Toronto Section.
The contact person listed below is the volunteer who has arranged this event.
Please use the e-mail link provided if you have any questions, suggestions,
or concerns.
| Title
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Test Challenge and Solution in High-speed IO |
| Speaker
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Dominic Lalli, M.Eng, National Instruments
Mohamed Hafed, Ph.D., DFTMicrosystems Inc.
|
| Day and Time
|
Thursday June 25, 2009
5:00 pm - Registration and Networking (light refreshment is provided)
5:30 pm – Introduction of High Speed IO – Albert Man
5:45 pm - Test solution for 400Mhz ~1 Gbps – Dominic Lalli
6:30 pm – Test solution for 2.0 Gbps~8Gbps – Mohamed Hafed
Attendance is free with registration: Send email to Albert Man ()
|
| Location
|
Seneca College, Newnham Campus
Building "A" Room A4089
1750 Finch Ave. East,
Toronto, ON M2J 2X5
map
|
| Organizer
|
Instrumentation and Measurement Chapter |
| Contact |
Albert Man () |
| Abstract
|
As the serial data rate approaches 1Gbps and beyond, Instrumentation vendors have come up with different strategy for design characterization and production. We will explore 2 low-cost test methods by National Instrument and DFTMicrosystems.
DFTMicrosytems offers a compact module that can be integrated to customers test environment and test I/O speed from 2.5Gbps to 5Gbps. National Instruments offers a range of high-speed digital I/O devices from 400 MHz to 1 Gbps that can perform functional tests, handshaking, complex pattern generation, design characterization, and stimulus-response testing. |
| Biography
|
Dr. Hafed is a cofounder of DFT Microsystems and serves as its Chief Technology Officer. He is the inventor of many of the innovations in the company’s products. Dr. Hafed is a recognized industry expert in the area of test and has served on several IEEE committees. He has received several national and international awards for his contributions to mixed-signal test technology, including "Best Paper" awards from both the IEEE International Test Conference and Micronet.
Dominic Lalli is a technical field engineer for National Instruments in Toronto and Southern Ontario. He joined NI in 2007 after graduating with a master’s degree in electrical engineering from McGill University. At NI, Dominic provides customers and prospects with technical support, advice, and consultation in a variety of industries and design, control, and test applications. |
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