Dr. Sang Wang, CEO
Nassda Corporation
| Organizer: IEEE Solid-State Circuits Society |
| Title: Nanometer Challenges and Dynamic
Analysis Techniques |
| Speaker: Dr. Sang Wang, CEO Nassda Corporation |
| Abstract: With the trend toward 90-nanometer process technologies, designers face major barriers arising from increased electrical and physical effects associated with dense interconnects and closely packed transistors. Already, advanced designs at 130 nm and below exhibit increasing non-digital behaviors such as dynamic IR drop, leakage current, electromigration and cross-coupling effects that can erode timing margins, introduce reliability problems and lead to circuit failure. Dynamic analysis techniques are the best approach to understand and resolve these challenging nanometer problems. |
| Biography: Dr. Wang was a Senior Vice President of Synopsys from 1997 to 1998. Prior to that, he was a cofounder and CEO of EPIC Design Technology from 1986 to 1997. EPIC went public in 1994 and was acquired by Synopsys in 1997. Dr. Wang received his MS from Ohio State University and Ph.D. from Stanford University. Dr. Wang was appointed to the Electronic Design Automation (EDA) Consortium board of directors in 2002. |
| Time and Location: Thursday November 21, 2002 Time: 6:00 PM Room 1240, Bahen Center (south side of building, behind the Future Cafe) U. of Toronto, 40 St. George. St. Underground parking is available. Parking entrance is off Huron St. just north of College St. |
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