Welcome to IPFA 2008 Home Page
The 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2008) is organized by the IEEE Reliability/CPMT/ED Singapore Chapter. The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society.
IPFA 2008 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies.
IPFA 2008 will continue the tradition of presenting enhanced physical and failure analysis, and reliability equipment and services exhibition. While the participants gets to know and see new tools, the equipment/service provider can obtain new insights or potential new requirments which could enhance their business.
For the first time in IPFA history, a photo contest will be held in IPFA 2008. This photo contest, Art of Failure Analysis, is to showcase the cretivity of failure analysts.
We look forward to your continued support in IPFA 2008.
IPFA 2008 Organising Committee
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