1st IPFA Photo Contest - Art of Failure Analysis 2008

Do you have a memorable image during your failure analysis work and feel there is an element of Art in it? Join IPFA’s 1st Photo Contest: Art of Failure Analysis 2008.

Where: Selected entries will be displayed and prizes awarded at the 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2008) on July 7-11, 2008 in Singapore.

Contest Criteria: SUBMITTED IMAGES ARE LIMITED TO ONE PER CONTESTANT and should complement the Art component. Images may be obtained by any material imaging technique. Because the focus is on art, the aesthetic rather than the technical quality of the image is the key criterion for the photo contest. Nevertheless, the images must have some connection to failure analysis.

Prizes:1st place receives S$500.00 and a Plaque
2nd place receives S$300.00
3rd place receives S$200.00
The top 10 entries selected will be displayed during IPFA 2008 and will receive an exclusive IPFA certificate
All cash prizes quoted above are in Singapore currency.