IPFA 2009 Technical Program

The detailed technical program will be online after 15 April. The overall technical program is given below.

8 July 2009	9 July 2009	10 July 2009
Session 1: OPENING CEREMONY Keynote Addresses	Session 5: Photovoltaic Reliability and Failure Mechanisms	Session 9: Sample Preparation, Metrology and Material Characterization
TEA BREAK	TEA BREAK	TEA BREAK
Session 2: Novel Gate Stack/Dielectrics and FEOL Reliability and Failure Mechanisms	Session 6: Die/Package-Level Failure Analysis Case Study and Failure Mechanisms	Session 10: PHYSICAL &CHEMICAL CHARACTERIZATION
LUNCH	Session 7: LUNCHEON/POSTER SESSION/ART OF FAILURE ANALYSIS	LUNCH
Session 3: Advanced Interconnects and BEOL Reliability and Failure Mechanisms		Session 11: ADVANCED FA 2
TEA BREAK	Session 8: Advanced Reliability Evaluation and Approaches	TEA BREAK
Session 4: Novel Device Reliability and Failure Mechanism		Session 12: NOVEL DEVICES 2
		CLOSING CEREMONY