The 19th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) will be held in Singapore at the Marina Bay Sands from 2 to 7 July 2012. IPFA 2012 is organized by the IEEE Reliability/CPMT/ED Singapore Chapter and is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society.
Singapore is one of the centers of the largest growing concentration of microelectronics technology expertise in Asia. At IPFA 2012, you will find researchers, engineers, technicians and others who work in the area of Failure Analysis in Wafer FAB, Packages, Board Assembly and Service Labs. The IPFA 2012 Exhibition will be held from 4 to 6 July 2012, in conjunction with the 3-day conference. As exhibitor, you are entitled to one complimentary registration for the conference.
Exhibition Dates and Hours
| Wednesday, 4 July | 9:30am – 5:30pm | |
| Thursday, 5 July | 9:30am – 5:30pm | |
| Friday, 6 July | 9:30am – 4:00pm |
Move-In
| Tuesday, 3 July | 1:00pm – 6:00pm |
Move-out
| Friday, 6 July | 4:00pm – 6:00pm |
For more information about the exhibition, please contact our Secretariat:
Jasmine Leong (Mrs)
IPFA Secretariat
Blk 121 Paya Lebar Way
#03-2801
Singapore 381121
Tel: (65) 6743 2523
Email: ipfa@pacific.net.sg
If you are interested to participate in the IPFA 2012 Exhibition, please download the following files:
IPFA2012-ExhInvLtr.pdf
IPFA2012-ExhInfoBooking.doc
IPFA2012-ExhBoothLayout.pdf
StandardShellSchemeBooth.pdf