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The 19th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) will be held in Singapore at the Marina Bay Sands from 2 to 7 July 2012. IPFA 2012 is organized by the IEEE Reliability/CPMT/ED Singapore Chapter and is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society.

Singapore is one of the centers of the largest growing concentration of microelectronics technology expertise in Asia. At IPFA 2012, you will find researchers, engineers, technicians and others who work in the area of Failure Analysis in Wafer FAB, Packages, Board Assembly and Service Labs. The IPFA 2012 Exhibition will be held from 4 to 6 July 2012, in conjunction with the 3-day conference. As exhibitor, you are entitled to one complimentary registration for the conference.

Exhibition Dates and Hours

Wednesday, 4 July       9:30am – 5:30pm
Thursday, 5 July       9:30am – 5:30pm
Friday, 6 July       9:30am – 4:00pm

Move-In

Tuesday, 3 July       1:00pm – 6:00pm

Move-out

Friday, 6 July       4:00pm – 6:00pm

For more information about the exhibition, please contact our Secretariat:
   Jasmine Leong (Mrs)
   IPFA Secretariat
   Blk 121 Paya Lebar Way
   #03-2801
   Singapore 381121
   Tel: (65) 6743 2523
   Email: ipfa@pacific.net.sg

If you are interested to participate in the IPFA 2012 Exhibition, please download the following files:
   IPFA2012-ExhInvLtr.pdf
   IPFA2012-ExhInfoBooking.doc
   IPFA2012-ExhBoothLayout.pdf
   StandardShellSchemeBooth.pdf