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BEST PAPER: IEEE Transactions on Components and Packaging Technologies:

1999:
"Low-Frequency Noise in Thick-Film Resistors Due to Two-StepTunneling Process in Insulator Layer of Element MIM Cell",
Milan M. Jevtic, Zravko Stanimirovic, and Ivanka Mrak -- Institute of Physics, Telecommunications and Electronics Institute, Belgrade Yugoslavia (march, 1999)
2000:
"Development of Virtual Reliability Methodology for Area-Array Devices Used in Implantable and Automotive Applications",
Suresh Sitaraman, Rajiv Raghunathan, and Carlton Hanna -
Georgia Institute of Technology, Intel Corp. (September 2000)

View these papers on-line: http://ieeexplore.ieee.org/