Call for Abstracts/Participation
for the 7th Annual
2001Workshop on Accelerated Stress Testing
AST 2001
September 24th, 25th and 26th, 2001
at
Doubletree Guest Suites Seattle-Southcenter
16500 Southcenter Parkway, Seattle, Washington
Sponsored by the
IEEE Components, Packaging and Manufacturing Technology Society
(TC-7)
And Technically Cosponsored by IEEE Reliability Society
In addition to two days of technical presentations, this workshop
will include a one-day tutorial from leaders in the field and
a two-day exhibition featuring AST related suppliers. Authors
are invited to submit abstracts on a variety of topics related
to Accelerated Stress Testing including the following targeted
topics:
· Advanced Approaches to AST
· Environmental Testing Conditions
· Reliability Improvement Techniques
· AST Data Collection/Analysis
· Failure Analysis Techniques and Examples
· Reliability Simulation and Prediction
· Application of Physics of Failure Techniques
· Stress Screening Techniques
Contributed Abstracts must be received, in English, by April 28th,
2001. Notification of acceptance will be provided by June 15th,
2001. All appropriate company and government clearances must be
obtained prior to submission. Authors should submit their abstracts
by the above date to the technical program chair via Email. Submissions
should not exceed one page and should be submitted in a file format
compatible with MS Word (WordPerfect, text, etc). Abstract title,
author names, affiliations, phone number, mailing, and email addresses
should begin each Abstract. . A final copy of their manuscript
or view foils is to be submitted by August 1st,2001. Your viewgraph
presentation only will be printed in the proceedings. Three hardcopies
of your final (camera ready) presentation package should be submitted
in addition to a MS PowerPoint file. Overhead VGA Projector (to
connect with presenters Laptop computer), VCR, slide, and facilities
will be available for presenters. Please send your 1 page abstract
to Paul Quiroz email: pquiroz@eer-m.com and with a copy to mark.gibbel@jpl.nasa.gov
Our Registration forms and Page will be available on-line soon.
Please Bookmark this page and visit for updates on the Workshop:
http://www.ewh.ieee.org/soc/cpmt/tc7/ast2001/