New IEEE Fellows in CPMT

IEEE announced the newly-elected IEEE Fellows . The individuals' election to Fellow grade was approved by the IEEE Board of Direcots at its 16 November 2003 meeting. Ten of these are members of the CPMT Society.

Rajen Chanchani, Sandia National Laboratories, for contributions to advanced packaging technologies.

Prof. Yan Cheong Chan, City University of Hong Kong, for contributions to electronic product reliability.

Hiromu Fujioka, Osaka University, for contributions to electron beam testing of semiconductor devices and circuits.

Erik H. M. Heijne, CERN, for contributions to semiconductor detector systems and radiation tolerant detector readout electronics.

Prof. R. Wayne Johnson, Auburn University, for contributions to electronics that must operate in harsh environments.

Kenneth Meade Lakin, TFR Technologies, for contributions to thin-film resonator technology and applications.

Douglas Strain, for leadership in the development of automated test and calibration systems.

Toshio Sudo, toshiba Corporation, for contributions to high-density packaging.

Prof. Stuart K. Tewksbury, Stevens Institute of Technology, for contribtuions to telecommunication and interconnections in high performance digital systems.

Prof. Ifeanyi Charles Ume, Georgia Institute of Technology, for contributions to the thermomechanical reliability of microelectric packaging.

As details of each of these contributors become available we will feature each in this newsletter.