EMCABS: 01-08-2011

A TIME-DOMAIN SYSTEM FOR CISPR 16-1-1 COMPLIANT MEASUREMENTS ABOVE 1 GHZ
+ Christian Hoffmann, ++ Peter Russer
+ Technische Universität München, Institute for High-Frequency Engineering, Munich, Germany
++ Technische Universität München, Institute for Nanoelectronics, Munich, Germany
c.hoffmann@tum.de
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19, T-Tu1-2, 2011, Jeju Island, Korea
Abstract: In this paper, a broadband time-domain EMI measurement system for measurements from 9 kHz to 18 GHz that complies with CISPR 16-1-1 is presented. The combination of floating-point analog-to-digital conversion and digital signal processing on a field-programmable-gate-array (FPGA) with the multi-stage broadband down-conversion enhances the upper frequency limit to 18 GHz. Measurement times are reduced by several orders of magnitude in comparison to state-of-the-art EMI receivers. The ultra-low system noise floor of 6-8 dB and the spectrogram mode allow for the characterization of the time behavior of EMI near the noise floor.
Index terms: CISPR 16-1-1, time-domain EMI measurement system, FPGA, low system noise floor.

EMCABS: 02-08-2011

MAGNETORESISTIVE SENSOR READOUT CIRCUIT AND FIELD CANCELING SYSTEM IN NEXT GENERATION NANO-FAB
+, ++ Feng-Chang Chuang, ++ Sen-Gui Shsu, + Ching-Yuan Yang, +++++ Tzyh-Ghuang Ma, +++ Yu-Lin Song, ++ Tzong-Lin Wu, ++++ Chwen Yu, ++ Luh-Maan Chang
+ National Chung Hsing University, Taichung, Taiwan
++ National Taiwan University, Taipei, Taiwan
+++ Yen Tjing Ling Industrial Research Institute, Taipei, Taiwan
++++ Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, Taiwan
+++++ National Taiwan University of Science and Technology, Taipei, Taiwan
carsonjuang2006@gmail.com
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19, T-Tu3-5, 2011, Jeju Island, Korea
Abstract: The extremely low frequency (ELF) magnetic fields from power-line current influences the yield of a CMOS foundry. The poor yield is due to ELF magnetic fields inducing directly the measurement or process equipment for cutting-edge chips below 28 nm process. The equipment of electron microscopes, including SEM, TEM, STEM, FIB writers and E-Beam Writers, are very susceptible to ELF magnetic fields emanating from various electrical power sources outside of and within the building. The next generation CMOS foundry recommends a maximum of 0.3 mG. There are three methods presented to reduce EMI, including active canceling system, passive shielding and hybrid canceling technology. The disadvantages of passive shielding is that it requires expensive material shielding to build an anti-magnetic chamber protecting sensitive equipment with high-m materials. This is the standard method in most cases of shielding. Furthermore, the active system is more flexible than the passive method. The active canceling method uses active coils with current sensing field via sensor and inducing man-made electromagnetic field to reduce the stray magnetic field. Unfortunately, the conventional system takes more time to produce field because of parasitical capacitance and resistance in the long coil. The longer the canceling coil constructed, the more time it takes. In addition, more time is spent in calibrating non-linear current amplifier through software design. This research results in the design of a simpler anti-electro-magnetic system instead of the typical frame and develops a one turn canceling coil structure to reduce delayed time. Several parallel cells generate fields up to 23.81 mG controlled by a micro processor unit. This system decreases the power-line inducing filed below 0.3 mG.
Index terms: Extremely low frequency, power-line current, CMOS foundry, passive shielding, active shielding, hybrid shielding.

EMCABS: 03-08-2011

DEVELOPMENT OF A WIDEBAND TRANSIENT ELECTRIC FIELD SENSOR
+ Zhang Xiaoming, + Meng Cui, ++ Wei Ming, ++ Liu Shanghe
+ Tsinghua University, Beijing, China
++Institute of Electrostatic & Electromagnetic Protection Ordnance Engineering College, Shijiazhuang, China
xm-zhang1986@hotmail.com
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19, T-We1-1, 2011, Jeju Island, Korea
Abstract: Based on the investigation of many related products, the paper presents the design and test of a wideband sensor for a transient electric field. With suitable electric circuit design and electronic component selection, some test results demonstrate that the sensor can satisfy time-domain and frequency-domain requirements. The sensor may play an important role in EMP and EMC research.
Index terms: Electric field sensor, frequency domain, time domain.

EMCABS: 04-08-2011

EFFECT OF EXTREMELY LOW FREQUENCY ELECTROMAGNETIC FIELDS ON LEVELS OF INTRACELLULAR REACTIVE OXYGEN SPECIES AND GENE EXPRESSION PROFILE IN MCF10A CELLS
+ Mi-Na Hong, + Bong-Cho Kim, ++ Yun-Sil Lee, +++ Yoon-Myung Gimm, ++++ Sung-Ho Myung, + Jae-Seon Lee
+ Korea Institute of Radiological and Medical Sciences, Seoul, Republic of Korea
++ Ewha Womans University, Seoul, Republic of Korea
+++ Dankook University, Yongin-si, Republic of Korea
++++ Korea Electrotechnology Research Institute, Changwon-si, Republic of Korea
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19, T-We3-6, 2011, Jeju Island, Korea
Abstract: Part I: The aim of this study was to investigate whether extremely low frequency magnetic fields (ELF-MF) (60 Hz) exposure has an effect on reactive oxygen species (ROS) formation in human breast epithelial cells (MCF10A). In this study, MCF10A cells were exposed to 60 Hz ELF radiation at 1 mT for four hours. During the exposure time, the temperature in the chamber was maintained isothermally by circulating water within the cavity of chamber. After ELF-MF exposure, reactive oxygen species and antioxidant enzyme activity were measured. A positive control group was exposed to 2 and 4 Gy doses of ionization radiation (IR). IR-exposed positive control groups showed morphological change of cells, the increase of the senescence associated β-gal staining (SA-β gal) and ROS production, antioxidant enzyme (SOD) activity, and the decrease of the oxidized glutathione levels. In contrast to the IR-exposed group, the ELF-MF exposed groups showed no significant differences in cell morphology, ROS production and activity of antioxidant enzymes. Therefore, the authors could conclude that ELF-MF exposure did not induce alteration of the intracellular ROS level in the MCF10A exposure condition.
Part II: Even though a number of studies have been conducted to elucidate whether extremely low frequency magnetic fields (ELF-MF) could induce alterations in various cell physiological processes, the issue has yet to be answered. To investigate the effects of ELF-MF on a gene expression profile, the authors conducted ELF-MF exposure with a magnetic flux density of 1 mT at 60 Hz to MCF10A cells for four and 16 hours, and analyzed gene expression profiling with Illumina Human HT-12 v3 Expression Bead-Chip. The authors did not found any gene which showed statistically significant alteration (>1.2 folds) in its expression level. Next, to confirm the results of chip analysis, the authors selected eight genes which altered their expression (<1.2 folds) without statistical significance, such as Interleukin 10 (IL-10), Coagulation factor III (F3), Interferon-induced protein with tetratricopeptide repeats 3 (IFIT3), ARP3 actin-related protein 3 homolog (ACTR3), Cyclin H (CCNH), DEAD (Asp-Glu-Ala-Asp) box polypeptide 17 (DDX17), Protein kinase, cAMP-dependent, regulatory, type I, alpha (PRKAR1A) and NEDD8 activating enzyme E1 subunit 1 (NAE1). The authors are currently analyzing their expression changes by reverse-transcription polymerase chain reaction (RT-PCR) after ELF-MF exposure.
Index terms: ELF magnetic field exposure, human breast epithelial cells, reactive oxygen species formation, antioxidant enzyme activity, gene expression profile.

EMCABS: 05-08-2011

MODELING OF FBGA PACKAGE FOR HIGH PERFORMANCE DIGITAL SYSTEM
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19, Poster I-11, 2011, Jeju Island, Korea
+ Bo Pu, + June-Sang Lee, + Jongmin Kim, + Wansoo Nah, ++ Myoungho Cha, Hyouk Lee
+ Sungkyunkwan University, Suwon, 440-746, Korea
++ R&D Institute HANA Micron Inc., Asan, 336-864, Korea
bobp@skku.edu
Abstract: This paper presents a novel model for the complete signal paths of a 484 pins Fine-Pitch Ball Grid Array (FBGA) package with parameters extracted from an improved Partial Element Equivalent Circuit (PEEC) method. The exact structure of coupled bonding wires with non-orthogonal elements, vias including nearby ground island, and package traces having 45° bend are combined in an analytical interconnect model for higher accuracy. Measured S-parameters validated the proposed electrical model, and the electrical characteristics of a FBGA package have been successfully analyzed.
Index terms: Component, equivalent circuit modeling, FBGA package, PEEC, electrical characterization, bonding wire.

PHOTO BY JANET O’NEIL

Student author Bo Pu, of Sungkyunkwan University in Suwon, Korea is shown near his poster paper titled, “Modeling of FBGA Package for High Performance Digital Systems,” presented at 2011 APEMC on Jeju Island, Korea. For more information on this paper, see EMCABS: 05-08-2011.

EMCABS: 06-08-2011

CHIP-PACKAGE-BOARD MODELLING FOR LCD DRIVER IC
Koji Sakuma, Toshi Sudo
Shibaura Institute of Technology, 3-7-5, Toyosu, Koto-ku, Tokyo, Japan
toshio@shibaura-it.ac.jp
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19, Poster II-12, 2011, Jeju Island, Korea
Abstract: Electromagnetic interference (EMI) from a liquid crystal display (LCD) has become more difficult as the pixel scanning speed becomes faster and the LCD panel becomes larger. In this paper, a chip-package-board model was established for the power distribution network (PDN) of the whole system. Then, switching currents were simulated by using the model. The effect of on-chip decoupling capacitance in particular was estimated for the two typical frequencies. One was a relatively slower frequency, corresponding to the line scanning speed. Another was a higher frequency of 50 MHz, corresponding to the pixel scanning speed.
Index terms: Electromagnetic interference, liquid crystal display, chip-package-board model, switching current, simulation.

EMCABS: 07-08-2011

MODELING, SIMULATION, AND MEASUREMENT OF COMMON-MODE CURRENT FOR AUTOMOTIVE ELECTROMAGNETIC COMPATIBILITY
+ Shingo Okada, ++ Takanori Uno, + Hideki Asai
+ Shizuoka University, Hamamatsu-shi, 432-8561 Japan
++ DENSO CORPORATION, Kariya-shi, Aichi, 448-8661 Japan
hideasai@sys.eng.shizuoka.ac.jp
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19, T-We5-2, 2011, Jeju Island, Korea
Abstract: In this paper, the authors introduce a practical equivalent circuit modeling for automotive electromagnetic compatibility (EMC). The modeling covers the inside of an integrated circuit (IC) on a printed circuit board (PCB), an attached wire harness, and surrounding parasitic elements. The equivalent circuit is suitable for the simulation of the common-mode current caused by switching devices in the IC, and thereby becoming the electromagnetic interference (EMI) source among automotive electronic devices. With the proposed equivalent circuit, more detailed and valid simulation and optimization can be performed for the common-mode noise reduction. Adequacy of the model is shown by confirming that the simulation results of the equivalent circuit agree with the actual measurement results of an evaluation board.
Index terms: EMI reduction, common-mode current, ECU, optimization algorithm.

EMCABS: 08-08-2011

EFFECT OF A SHELTER ON SVSWR VALIDATION AT OATS
+ Jungyu Yang, +++ Seungwoo Lee, ++ Hongsik Keum, +++ Nam Kim
+ Radio Research Agency, Seoul, Korea
++ Korea Radio Promotion Association, Seoul, Korea
+++ Chungbuk National University, Cheongju-si, Chungbuk, Korea
namkim@chungbuk.ac.kr
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19, T-We2-7, 2011, Jeju Island, Korea
Abstract: In this paper, the authors researched the effect of a shelter on the site voltage standing wave ratio (SVSWR) verification of an OATS (open area test site). The result of the SVSWR measurement taken outside the shelter at the OATS-A was recorded as 4.4 dB or less and that at the OATS-B was recorded as 4.65 dB or less. Thus, it is concluded that the measured values outside the shelter at both test sites did not exceed the limit value of 6 dB. However, the results taken inside the shelter at both sites were recorded as 6.61 dB or less and 25.63 dB or less, respectively. Thus, it is concluded that the measurement results obtained inside of the shelter indicate that reflected waves are generated inside the shelter. The authors verified that the site validation requirements will be satisfied, if it were more than 6 m away from an obstacle and the absorbers were located where they can fully absorb the reflection waves. Further consideration should be given with regard to the building materials of a shelter because the current shelter might not provide a satisfactory test environment over a frequency of 1 GHz or above.
Index terms: Site-VSWR, shelter, OATS.

EMCABS: 09-08-2011

VERTICALLY ALTERNATING IMPEDANCE ELECTROMAGNETIC BANDGAP (VAI-EBG) STRUCTURE FOR NOISE MITIGATION IN MULTI-LAYER PCBS
Myunghoi Kim, Kyoungchoul Koo, Sunkyu Kong, Bumhee Bae, Sangrok Lee, Joungho Kim
KAIST, 373-1 Guseong-dong, Yuseong-gu, Daejeon 305-701, Republic of Korea
mhkim80@kaist.ac.kr
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19, S-Tu2-3, 2011, Jeju Island, Korea
Abstract: In this paper, the authors propose a vertically alternating impedance electromagnetic bandgap (VAI-EBG) structure for significant mitigation of power/ground noise in multi-layer printed circuit boards (PCBs), which greatly improves the power/ground noise suppression in the frequency range 800MHz to 10GHz with -50dB isolation. The significant improvement of power/ground noise isolation is enabled using vertically alternating impedance which is implemented by vertical branches and vertically-distributed patches. Test vehicles are fabricated using standard PCB process and the power/ground noise suppression of proposed VAI-EBG structure is verified through measurements.
Index terms: Vertical, alternating impedance, power/ground noise, electromagnetic bandgap.

EMCABS: 10-08-2011

EMCABS: 11-08-2011

APPROACH FOR THE THREAT ASSESSMENT OF E1 HEMP AND WIDEBAND IEMI ON COMMERCIAL ELECTRONICS
W. A. Radasky, E. B. Savage, J. L. Gilbert
Metatech Corporation, CA, USA
wradasky@aol.com
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19,
S-We1-1, 2011, Jeju Island, Korea
Abstract: The increasing concerns expressed in the public media over the high-altitude electromagnetic pulse (HEMP) nuclear threat and the emerging criminal and terrorist threat of Intentional Electromagnetic Interference (IEMI) has led the authors to develop a technical approach for assessing and protecting the electronics in commercial buildings from these high-frequency electromagnetic threats. This paper briefly describes the threats and indicates the steps to perform a comprehensive assessment of the need for protection.
Index terms: HEMP, IEMI, HPEM threats, electromagnetic assessments.

EMCABS: 12-08-2011

METHOD FOR EVALUATING EMI OF IMPLANTED MEDICAL DEVICES FROM BODY AREA NETWORK DEVICES
Satoshi Ishihara, Takahiro Iyama, Teruo Onishi, Yoshiaki Tarusawa
NTT Docomo, Inc., Yokosuka, Japan
Proceedings of 2011 Asia-Pacific EMC Symposium, May 16–19,
S-We2-3, 2011, Jeju Island, Korea
Abstract: This paper proposes the method for evaluating the electro-magnetic interference (EMI) of implanted medical devices that is incurred from body area network (BAN) devices. The investigation is based on both measurement and calculation. As the calculation method, the finite-difference time-domain (FDTD) method is used. Two types of transmitters are considered for the BAN devices, and results confirm the effectiveness of the proposed EMI evaluation method employing a torso phantom, which has been used for evaluating EMI of implanted medical devices from mobile phones, radio frequency identification (RFID) readers/writers, and so on.
Index terms: EMI, evaluation method, implanted medical device, body area network, FDTD method, torso phantom.                          EMC