IEEE – IAS/IES
DINNER PRESENTATION
Wednesday, October 19, 2011
ATS Withstand Ratings including 30 Cycle Ratings and Selective Coordination
Presenters: Andrew Best- Field Sales Engineer Š ASCO Technologies
ABOUT THE SPEAKERS
Andrew has been with ASCO Power Technologies as a Field Sales Engineer for 3 years and has done research and presentations on this topic. He has a B.S.E.E. Is from Purdue University and is currently in the MBA program at Northern Illinois University
ABOUT THE TOPIC
We will discuss what withstand ratings mean as defined by UL, how this test is conducted and why itÕs important. This will cover both 3 cycle ratings and short time ratings. We will then review NEC codes and how they apply to transfer switches. This will include defining how short time ratings impact electrical design and what kind of impact short time rated transfer switches have on the both footprint and cost. We will also address how selective coordination impacts arc flash levels and how zone selective interlocking can mitigate some of these effects. Finally we will touch on some best practices currently promoted by design engineers and possibly open this topic to group discussion.
LOCATION Time
PARTHENON
(GREEKTOWN)Social................................................................... 5:30 p.m.
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Directions |
Cost |
Reservations |
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Parthenon is located in Greektown on Halsted between Van Buren and Jackson.
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Your cost includes the
presentation and a four-course dinner with a choice of the main entry - Roast
lamb, Chicken, or Fish. (Vegetarian or special dietary meals available upon
request). Cost is $25 IEEE Member and $30 non-member. Valet parking is included
with your meal. |
Please call the IEEE Business Office (630) 493-4333 with your reservation. Please note any special meal requests at the time of the reservation. Click
here to make your reservation online.
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Note: For P.E. licenses that require continuing education for renewal, attendance at IEEE Technical Meetings is acceptable as one Professional Development Hour (PDH) per meeting.