T8: NETWORKED AND DISTRIBUTED MEASUREMENT SYSTEMS

To be presented by Kang B. Lee on April 30 (Monday), 1:30 – 4:30 pm

 

Contents

Networked and distributed measurement and control systems have emerged in industry attribute to the advance of microelectronic and networking technology. They have replaced the traditional centralized measurement and control approach. To lower costs and to be able to access multiple sources, proprietary hardware and software designs and platforms for these types of systems are shelved in favor of open system and standardized approaches. This tutorial describes the concept of distributed measurement and control systems, distributed control architecture, sensor and actuator interfaces, networked measurement and control, smart sensor standardization approach, smart sensor object and data models, client-server and publish-subscribe communication models, clock synchronization approach for networked measurement and control systems, and examples of application for these types of systems.

 

Target audience

Students, academicians, practitioners, or managers interested in networked and distributed measurement and control systems.

 

Presenter’s biography

Kang Lee is Leader of the Sensor Development and Application Group of the Manufacturing Engineering Laboratory at the National Institute of Standards and Technology (NIST).  Kang has over thirty years of experience in the fields of electronic instrumentation design, measurement automation, robotic and flexible manufacturing systems, machine tool error compensation, smart machine tools, sensor networking, distributed measurement and control, smart sensor interface and clock synchronization standards, wireless sensor systems, and sensor-enabled RFID.  Kang received his Bachelor of Science Degree in Electrical Engineering from the Johns Hopkins University and Master of Science in Electrical Engineering from the University of Maryland.