CALL FOR PAPERS



IMTC2004


2004 IEEE Instrumentation and Measurement Technology Conference
From the Electrometer to the Networked Instruments:
A Giant Step toward a Deeper Knowledge


Como, Italy
18-20 May 2004 (Tuesday-Thursday)





CALL FOR PAPERS
SUBMISSION DEADLINE HAS BEEN EXTENDED TO 10 OCTOBER 2003 !!!


The conference studies all aspects of instrumentation, measurement and control technologies - theory, research and development and applications. Program topics include but not limited to:

MEASUREMENT SCIENCE
Metrology & standards
Measurement principles education
DATA ACQUISITION
Sensors & transducers, smart sensors
Calibration & self-calibration
A/D, D/A & data acquisition
Remote measurements & telemetry
Waveform measurement, analysis, generation
Sensitivity & noise
INSTRUMENTATION TECHNOLOGIES
Automated test & measurement systems
Instrumentation & prototype development
Frequency, microwave and laser systems
Integrated & visual measurement systems
Human-computer interface
Networked & distributed measurements
Autonomous sensing/measurement systems
Non-invasive instrumentation & measurement
Measurement microsystems
Testing & diagnosis of I&M systems
Fault-tolerant & resilient I&M systems
DATA PROCESSING TECHNOLOGIES
Analog, digital & mixed-signal processing
Image processing & imaging systems
Identification, control & distributed monitoring
System prediction & sensor fusion
Soft computing for intelligent I&M systems
PHYSICAL QUANTITIES MEASUREMENTS
Electrical & power measurements
Dielectric, magnetic and EMC measurements
Temperature, moisture, humidity measurements
Mechanical quantities & material analysis
Optical & nuclear measurements
Chemical & biological measurements
MEASUREMENT APPLICATIONS
Robotics, industrial automation & manufacturing
Automotive & transportation
Avionics & aerospace
Environmental monitoring
Medicine & science
Security & biometrics
Telecommunications
Virtual environments

Authors should submit electronically 1 copy of an extended abstract (3 or 4 pages) in English, reflecting new or advanced study, theory or application and including the significance of the contribution, a list of references and figures or tables. Abstracts must be prepared according to the Abstract Preparation Guide and must be accompanied by an Abstract Submission Form. Both documents may be downloaded from the IMTC website - https://www.ieee-imtc.org Check the website for all instructions and details.

Papers will be reviewed by the IMTC International Program Committee. Authors of accepted abstracts must guarantee they will register at the conference, pay registration fees, attend and present their papers. An accepted paper will be published in the proceedings only if the final manuscript is accompanied by registration form(s) and fee(s) for at least one of the authors (only full member/non-member fees will be allowed - no exceptions!) One author registration will cover publication of up to 2 accepted papers; each additional paper with the same registration will require a printing contribution of US$50.

Authors of presented papers are invited to submit extended manuscripts to the special issue of IEEE Transactions on Instrumentation & Measurement on IMTC/2004, to be published in 2005.


Important dates for authors:

10 OCTOBER 2003 - Deadline for submitting abstracts with Abstract Submission Forms: submissions must be received by this deadline! Submit abstracts to lee.myers@ieee.org.

19 December 2003 - Author notification of acceptance or rejection

1 March 2004 - Deadline for receipt of the final manuscript


For additional information, contact

Robert Myers or Lee Myers
799 North Beverly Glen, Los Angeles, CA 90077, USA
phone: +1 (310) 446-8280
fax: +1 (310) 446-8390
email: lee.myers@ieee.org





The call for paper is available also in the following electronic formats: