SPECIAL SESSIONS



Special Sessions are being developed by designated chairs. If an author has a paper that could be included in one of these sessions, he/she may submit an abstract and note it is a "candidate for Special Session on". If the abstract is not selected for the session, it may be included in another part of the technical program.

To submit abstracts or draft papers to the special session, please follow the submission instructions for regular sessions but remind to specify the special session to which the paper is directed.

The deadline to submit a paper to a special session is 30 OCTOBER 2004. This deadline is valid ONLY for the special sessions: papers for regular sessions MUST be submitted by 4 OCTOBER 2004.

Special sessions at IMTC/05 are being organized on these subjects:
  • MEASUREMENT IN GROUND TRANSPORTATION SYSTEMS
    Organizers:
    Dr. Georg Brasseur, Graz University of Technology, Austria
    Dr. Frans C.A. Groen, Science University of Amsterdam, The Netherlands

    Sensor development, sensor data interpretation and sensor data fusion plays a crucial role in intelligent ground transportation systems. Challenges are in particular present in the integration of in vehicle and off-road sensor systems. This special session focuses on measurement systems based on radar technology, vision, laser based speed and distance measurement, ultrasound measurement and in general on sensors & devices for intelligent ground transportation systems including data interpretation and fusion.

  • SYSTEM-ON-CHIP (SOC) INTEGRATED CIRCUITS - DESIGN AND TEST
    Organizer: Dr. Sunil R. Das, University of Ottawa, Ottawa, ON, Canada and Troy State University Montgomery, Montgomery, AL, U.S.A.

    Topics include but are not exclusively confined to : Test scheduling and test access mechanisms for core-based SOCs : designing test access mechanism, test set selection, test resource placement, and power-constrained test scheduling approach ; reconfigurable wrapper design ; deterministic test vector compression and decompression ; test data compression for memory BIST ; role of crosstalk and faults for signal integrity loss in high speed SOCs ; BIST for detecting clock skew and noise, etc.

  • ADVANCED DESIGN AND TEST METHODOLOGY FOR SOC (SYSTEMS-ON-CHIP) TECHNOLOGY Organizers:
    Dr. Yong-Bin Kim, Northeastern University, USA
    Dr. Nohpill Park, Oklahoma State University, USA

    Semiconductor deep-submicron device effects complicate design and test tasks for system level integration. Design and test methodology is a key to the success of the modern system level integration. Furthermore, since the time to market is very critical factor these days, the importance of reusable Intellectual Property/Proprietary (IP) block design concept is ever increasing. As MEMS are being integrated with other circuits, MEMS CAD and NANO circuit design and test flow is receiving more attention.
    This special session will cover all aspects of theory and practice of SoC design and test methodology including innovative circuit design techniques such as clockless circuit, power estimation methodology, timing analysis flow, clock/power distribution, clock skew analysis methodology, design for test and reliability test algorithm, physical design methodology such as signal integrity analysis and place/routing method, decoupling capacitance estimation, circuit design and test methodology in NANO technology, VLSI and system CAD, MEMS CAD, RF circuit design methodology, and analog circuit design testability.

  • INSTRUMENTATION AND SENSORS FOR FARMING
    Organizer: Dr. Miguel A. Perez, Oviedo University, Spain

  • ENVIRONMENTAL MONITORING
    Organizer: Dr. Gabriele D'Antona, Politecnico di Milano, Italy

  • RF AND MICROWAVE MOISTURE SENSING APPLICATIONS
    Organizers:
    Dr. Stuart Nelson, US Department of Agriculture, USA
    Samir Trabelsi, Quality Assessment Research Unit ARS-USDA, USA