Joint Meeting of
the Waveform Generation, Measurement, and Analysis Committee (TC-10) of the IEEE Instrumentation and Measurement Society
and
IMEKO Working Group on ADC and DAC Metrology



During the 2004 IEEE Instrumentation and Measurement Technology Conference, a Joint meeting organized by the Waveform Generation, Measurement, and Analysis Committee (TC-10) of the IEEE Instrumentation and Measurement Society and IMEKO Working Group on ADC and DAC Metrology will be held Wednesday, 19 May 2004, afternoon 04.30pm-06.30pm. The meeting will provide an opportunity for users, developers, and researchers involved in ADC and DAC standardisation, research and education to discuss the last activities in these fields.