Nondestructive Characterization of Critical Current Distribution
Across the Width of Coated Conductor Tapes

Koichi Nakao, Takato Machi, Seiji Adachi, Keiichi Tanabe

Abstract — For AC applications of coated conductors, tape width must be small enough to reduce the AC loss. The natural solution is the multi-filamentary structure realized by slicing or scribing wide tapes. If there is substantial inhomogeneity in the critical current value across the width of the original tape, slicing or scribing it into filaments may seriously degrade the final performance of the multi-filamentary conductor. A simple procedure based on Hall sensor array measurements to characterize the homogeneity across the width is proposed.

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