Characterization of Coated Conductors
Using Raman Spectroscopy Methods

Victor A. Maroni

Abstract — This paper outlines the type of information gained from the use of Raman micro-spectroscopy methods to examine REBCO coated conductor embodiments. The topics covered include (1) the attributes and limitations of Raman spectroscopy when used as a guidance tool for coated conductor performance enhancement, (2) the features, details, differences, and length scales for which Raman is both suitable and informative, (3) the potential applicability of Raman methods for use as ex-situ and in-situ probes of phase and microstructure development (considering both off-line and on-line implementation), (4) the extent to which Raman methods can be used to characterize the underlying buffer layers and diffusion barriers, and (5) the idiosyncrasies and limitations of Raman methods for the comprehensive interrogation of coated conductors, including considerations pertaining to sampling depth and through-thickness measurements.

Full Text, PDF