Special Sessions on Integrated Materials

Charge Trapping and Its Impact on Devices and Circuits

Gilson Wirth
Federal University of Rio Grande do Sul

Abstract: Charge trapping produces noise and aging in nanometer scale devices [1-3]. This may be seen as a time dependent degradation in devices and circuits [4-6]. We show that with area scaling increasing variability in noise and aging is a more relevant concern than the increase in expected (average) degradation. We address the time dependent variability from device to circuit level. Circuit level analysis includes discussing how charge trapping may induce time dependent mismatch. We also show that, compared to the case of white noise, with charge trapping oscillator jitter grows faster with elapsed time.