SiC CMOS Integrated Circuits and Image Sensors for Extreme Environment Applications
Biography: Shin-Ichiro Kuroki is Professor of Hiroshima University, and Vice-Director of Research Institute for Nanodevices (RIND), Hiroshima University, Japan. He received Ph. D degree in physics from Hiroshima University in 2002. From 2002 to 2005, he worked for Research Center for Nanodevices and Systems of Hiroshima University as Researcher for Industry-University-Government cooperation, where he worked on the process and the reliability technologies for Cu/Low-k interconnection of LSIļ¼In 2005, he jointed Graduate School of Engineering, Tohoku University, Japan, as Assistant Professor, where he worked on the areas of device and process technologies in silicon integrated circuits and also silicon thin film transistors. In 2012, he joined Research Institute for Nanodevice and Bio-Systems (RNBS), Hiroshima University, as Associate Professor. In 2019, he became Professor of Hiroshima University. His current research interests are Silicon Carbide (SiC) CMOS integrated circuits and imaging devices for high temperature and high radiation environment applications.