Invited Speaker

Process Control Challenges and Solutions for Advanced Semiconductor Devices

Yunjung Jee (NOVA)

Biography: Dr. Yun Jung Jee is the regional marketing director in Nova. She received the M.S. and Ph.D. degrees in Physical Chemistry from Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Korea. After receiving her Ph.D. in 2002, she joined Samsung Electronics and worked as a project leader for the advanced metrology team of the memory business where she contributed to product development by integrating new optical, X-ray, and e-beam technologies and methodologies into metrology. At Samsung, she led the TF team’s metrology group for various DRAM and VNAND device developments for many years and served as a defect metrology project engineer at SEMATECH from 2009 to 2011. She moved to Nova in 2021 and is responsible for North Asia regional marketing and metrology solutions strategy.