IEEE SENSORS 2009

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Organizing Committee

Technical Program Committee

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Technical Program Committee

Adjeroh, DonaldWest Virginia University, USA
Al-Shamma'a, AhmedLiverpool John Moores University, UK
Andersson, HeleneKTH Stockholm, SWEDEN
Arregui, Francisco J.Universidad Pública de Navarra, SPAIN
Atashbar, MassoodUniversity of Michigan, USA
Barsan, NicolaeUniversity of Tübingen, GERMANY
Barsony, IstvanHungarian Academy of Sciences, HUNGARY
Bart, StephenAnalog Devices, USA
Basheer, MohammedQueens University, Belfast, UK
Bhethanabotla, VenkatUniversity of South Florida, USA
Bossche, AndreDelft University of Technology, THE NETHERLANDS
Briand, DanickDelft University of Technology, SWITZERLAND
Carlen, EdwinUniversity of Twente, THE NETHERLANDS
Cernosek, RichardSandia National Laboratories, USA
Chang, Pei-ZenNational Taiwan University, TAIWAN
Chorpening, BenjaminNational Energy Technology Laboratory, Department of Energy, USA
Chou, Jung-ChuanNational Yunlin University of Science & Technology, TAIWAN
Chun, KukjinSeoul National University, KOREA, SOUTH
Cole, MarinaUniversity of Warwick, UK
Comini, ElisabettaUniversità di Brescia, ITALY
Conde, OlgaUniversity of Cantabria, SPAIN
Creemer, FrederikDelft University of Technology, THE NETHERLANDS
cretu, EdmondUniversity of British Columbia, CANADA
Dadarlat, VasileUniversitatea Tehnica Cluj-Napoca, ROMANIA
Diem, BernardCEA, FRANCE
Eickhoff, MartinJustus Liebig-Universitat Geissen, GERMANY
Engel, JonathanHoneywell International, USA
Ewald, HartmutRostock University, GERMANY
Faraone, LorenzoUniversity of Western Australia, AUSTRALIA
Fedder, GaryCarnegie Mellon University, USA
Ferrari, VittorioUniversity of Brescia, ITALY
Fitzpatrick, ColinUniversity of Limerick, IRELAND
Frolik, JeffUniversity of Vermont, USA
Fuchs, AntonTechnical University of Graz, AUSTRIA
Gao, ZhiqiangInstitute of Bioengineering and Nanotechnology, SINGAPORE
Gourab, Sen GuptaMassey University, NEW ZEALAND
Gutierrez Osuna, RicardoTexas A & M University, USA
Hauptmann, PeterUniversity of Magdeburg, GERMANY
Higurashi, EijiUniversity of Tokyo, JAPAN
Horsley, DavidUniversity of California, Davis, USA
Huang, Qing-AnSouth East University, CHINA
Jakoby, BernhardJohannes Kepler University Linz, AUSTRIA
Jiang, HongruiUniversity of Wisconsin, USA
Jiang, XiaoningTRS Technologies, Inc., USA
Jung, Hyo-ilYonsei University, KOREA, SOUTH
Kang, Shin-WonKyungpook National University, KOREA, SOUTH
Kim, Chang-SooMissouri University of Science & Technology, USA
Kraft, MartinCarinthian Tech Research, AUSTRIA
Lang, WalterUniversity of Bremen, GERMANY
Lange, DirkGeneral Electric, SWITZERLAND
Lee, Dong-WeonChonnam National University, KOREA, SOUTH
Lee, Jeong-BongUniversity of Texas, Dallas, USA
Lee, Jong-HyunGwangju Institute of Science and Technology (GIST), KOREA, SOUTH
Lee, SukhanSungkyun Kwan University, KOREA, SOUTH
Lerch, ReinhardUniversity of Erlangen, GERMANY
Li, Wen JungChinese University of Hongkong, HONG KONG
Li, XiaochunUniversity of Wisconsin, USA
Li, ZhihongPeking University, CHINA
Li, XinxinShanghai Institue of Microsystem and Information Technology, CHINA
Lin, Yu-ChengNational Cheng Kung University, TAIWAN
Lloyd Spetz, AnitaLinköping University, SWEDEN
Lochmann, SteffenHochschule Wismar University, GERMANY
Loloee, RezaMichigan State University, USA
Lyons, WilliamCity University, London, UK
Makinwa, KofiDelft University of Technology, THE NETHERLANDS
Malcovati, PieroUniversity of Pavia, ITALY
Matias, IgnacioUniversidad Pública de Navarra, SPAIN
Matsumoto, YoshinoriKeio University, JAPAN
McDonagh, ColetteDublin City University, IRELAND
Meng, EllisUniversity of Southern Califonira, USA
Mignani, Anna GraziaCNR, Florence, ITALY
Minh, Phan NgocVietnam Academy of Sience and Technology, VIETNAM
Morgan, BrianUS Army Research Laboratory, USA
Mueller, IngoHochschule Wismar University, GERMANY
Nakamoto, TakamichiTokyo Institute of Technology, JAPAN
Newe, ThomasUniversity of Limerick, IRELAND
Nishida, ToshiUniversity of Florida, USA
Ohyama, ShinjiTokyo Institute of Technology, JAPAN
Park, Jae Y.Kwangwoon University, KOREA, SOUTH
Pickrell, GaryVirginia Tech, USA
Post, MichaelNational Research Council of Canada, CANADA
Puiu, Poenar DanielNanyang Technological University, SINGAPORE
Rajanna, KonandurIndian Institute of Science, INDIA
Renaud, PhilippeEcole Polytechnique Fédérale de Lausanne (EPFL), SWITZERLAND
Ripka, PavelCzech Technical University, CZECH REPUBLIC
Ruther, PatrickUniversity of Freiburg - IMTEK, GERMANY
Schmid, UlrichVienna University of Technology, AUSTRIA
Sonkusale, SameerTufts University, USA
Stemme, GoranKTH - Royal Institute of Technology, SWEDEN
Su, MingUniversity of Central Florida, USA
Sun, TongCity University, London, UK
Suzuki, HiroakiUniversity of Tsukuba, JAPAN
Tan, Ooi KiangNanyang Technological University, SINGAPORE
Tang, ZilongTsinghua University, CHINA
Tatic-Lucic, SvetlanaLehigh University, USA
Tay, Eng Hock, FrancisNational University of Singapore, SINGAPORE
Tjin, Swee ChuanNanyang Technological University, SINGAPORE
Tsutsumi, KazuhikoWaseda University, JAPAN
Tuantranont, AdisornNational Electronics and Computer Technology Center, THAILAND
Ueda, ToshitsuguWaseda University, JAPAN
Wang, PingZhejiang University, CHINA
Wang, Qing-MingUniversity of Pittsburg, USA
Wang, XuefengGeneral Electric, USA
Wang, ZheyaoTsinghua University, CHINA
Wiczer, JamesSensor Synergy, USA
Wlodarski, WojtekRMIT University, AUSTRALIA
Xia, ShanhongChinese Academy of Sciences, CHINA
Xu, YongWayne State University, USA
Yang, Sang SikAjou University, KOREA, SOUTH
Ye, XiongyingTsinghua University, CHINA
Yobas, LeventInstitute of Microelectronics, SINGAPORE
Zou, JunTexas A & M University, USA

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