Abstract: The Charged Device Model for ESD (CDM) is the "real world" model which describes ESD-related damage to IC components from automated manufacturing / handling.  After an initial description of CDM (contrasting to other ESD models), the effects on discharge peak current / energy in terms of package characteristics will be discussed.  Following this will be examples of manufacturing process steps known to cause CDM charging / discharging issues (both for components by themselves and assembled on systems).  Finally, the current industry perspective on CDM will be reviewed with key issues in technology / standards.
Biography: Alan Righter currently is a External Foundry ESD Advisor for Analog Devices in Wilmington, MA, having worked there since 1997.  Previous to that, he worked at Sandia National Laboratories in Albuquerque, NM from 1984-1997 in different aspects of microelectronics (design, test, product engineering / reliability, and failure analysis).  He holds BSEE / MSEE degrees from Arizona State University and a PhD from the University of New Mexico.  Alan currently chairs the ESD Association CDM working group committee WG5.3.1, responsible for the Charged Device Model standard document ANSI/ESDA STM5.3.1 from the ESD Association.  He is also on the Industry Council for ESD Target Levels, a council of ESD experts tasked to review and recommend safe, reliable ESD levels for the electronics industry reflecting current ESD controls and IC design/manufacturing technology.