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Ultrahigh-Speed Wireless Digital Bus Interconnects Using Electromagnetic Bandgap (EBG) Technology Since their inception, computers have been constructed using baseband metallic interconnects to transfer data between processors. Much above present clock rates, however, problems with signal integrity, cross-coupling, radiation, and loss may render this type of interconnect impractical. Since clock rates in the microwave frequency range are projected by 2010, attention is being drawn toward alternative technologies that have relatively favorable signal transmission characteristics. We are investigating the alternate possibility of using bandpass wireless interconnects at millimeter-wave frequencies. In this talk, I will discuss our computational and experimental study of a promising waveguiding structure for such interconnects: linear defects in periodic electromagnetic bandgap (EBG) structures. Initially developed by the optics community, EBG structures are a periodic array of scatterers that limit the propagation of a “band” of frequencies in a given direction. Some of the advantages of our EBG waveguiding interconnects are that they can be fabricated with conventional circuit-board technology, allow wave confinement within a low-permittivity medium (thereby permitting signal transmission at nearly the speed of light), provide less copper loss over traditional interconnect structures, and have dimensions which scale inversely to the operating frequency. I will highlight our most recent results for both straight and 90° bend EBG waveguides operating at a center frequency of 50 GHz and also show that when further scaled to millimeter-wave center frequencies above 300 GHz, this technology appears feasible of supporting data rates in the hundreds of Gb/sec. |
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