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Technical Seminar

Distinguished Lecturer Series


Mixed-Mode ESD Protection Simulation-Design for Integrated Circuits


DATE/TIME  Friday, April 11, 2003 ( 4:30pm to 6:00pm)
PLACE  Glover Bldg. Rm. 201 (CSU, Fort Collins, CO)

ABSTRACT  ESD (Electro-Static Discharge) induced failure becomes a major IC reliability problem as semiconductor IC technologies migrate into the VDSM (very-deep-sub-micron) ULSI (ultra large scale integration) regime.  On-chip ESD protection circuitry is required to protect IC chips against ESD damages.  Particularly, ESD design for mixed-signal & RF IC is a new challenge to IC designers.  Currently, trial-and-error approaches still dominate in ESD design practices, largely due to the lack of predictive ESD simulation capacity.  This talk will outline the principles of ESD protection circuit design and discuss a new mixed-mode ESD simulation-design methodology developed at the Integrated Electronics Laboratory, Illinois Institute of Technology.  Practical ESD protection circuit design examples will be provided. This lecture aims to assist IC circuit designers in dealing with real-world ESD protection circuit design problems.  Those who are interested in more details are referred to a short course, ECE723 Advanced ESD Protection Design For Integrated Circuits, offered by the Department of ECE at the Illinois Institute of Technology and the University of California at Berkeley Extension Short Course Series.
PRESENTATION SLIDES  pdf
REFERENCE  ON-CHIP ESD PROTECTION FOR INTEGRATED CIRCUITS: An IC Design Perspective, by Albert Wang, Kluwer Academic Publishers, 2002, ISBN: 0-7923-7647-1.

PROF. ALBERT WANG (Illinois Institute of Technology, Chicago, IL)
Albert Wang received the BSEE degree from Tsinghua University, China, in 1985 and the PhDEE degree from The State University of New York at Buffalo in 1995.  He was with National Semiconductor Corporation until 1998 when he joined the Faculty of Electrical and Computer Engineering of the Illinois Institute of Technology, where he is currently directing the Integrated Electronics Laboratory.  His research interests center on analog/mixed-signal/RF ICs, advanced on-chip ESD protection, IC CAD and modeling, SoCs and semiconductor devices, etc.  He received the CAREER Award from the National Science Foundation in 2002.  He is the author of the book "On-Chip ESD Protection for Integrated Circuits" (Kluwer, 2002) and more than sixty papers in the field, and holds several U.S. patents.
He is an Editor for the IEEE Electron Device Letters and an Associate Editor for the IEEE Transactions on Circuits and Systems II.  He is an IEEE Distinguished Lecturer for the Electron Devices Society and the Solid-State Circuits Society, an IEEE EDS AdCom Member, Vice Chair of EDS Regions and Chapters Committee for North America West and a Member of the EDS VLSI Technology and  Circuits Committee. He serves as Technical Program Committee Member, Sub-Committee Chair and Session Chair for many conferences, e.g., IEEE CICC, RFIC, APC-CAS, ASP-DAC, etc.  He is an IEEE Senior Member, a frequent speaker at various industrial, academic, and international forums and a frequent consultant to the IC industry.
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