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WMED-2010 Technical Program |
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Technical Program Information 2010 IEEE Workshop on
Microelectronics and Electron Devices Friday, Device & Process Session 4:15p Jasper
Gibbons, Micron Technology "Discrete Test Structure Device Degradation
Analysis and Correlation to NAND Flash Circuit Operation" 4:30p Shu Qin, Micron Technology "Study of Carrier
Mobility of Low-Energy, High-Dose Ion Implantations using Continuous Anodic
Oxidation Technique/Differential Hall Effect (CAOT/DHE) Measurements" 4:45p 5:00p Guohua 5:15p Michael Smith, Micron Technology
"A Novel Depletion Mode High Voltage Isolation Device Micron
Devices" 5:30p Abhijeet Circuits Session 4:15p Suat Ay, Univ of 4:30p Seong-hoon 4:45p Qawi 5:00p Suat Ay, Univ of 5:15p 5:30p Kuangming Yap, Important Workshop Dates
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This workshop is receiving
technical co-sponsorship support from the IEEE Electron Devices Society. |
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