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IEEE Workshop on Microelectronics and Electron Devices (WMED)

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WMED-2011 Call For Papers Special Note for International Authors If you require a US VISA and letter of acknowledgment from WMED in order to attend the workshop and present your paper, we strongly urge that you submit your manuscript early (recommended manuscript submission by 1/14/2011) and request "expedited review". The Ninth Annual IEEE Workshop on Microelectronics and Electron Devices will provide a forum for reviewing and discussing all aspects of microelectronics including processing, electrical characterization, design and new device technologies. This symposium will consist of both invited and contributed talks and papers as well as a poster session throughout the afternoon. Faculty, students, and researchers in industry are encouraged to contribute presentations on either completed research or �work-in-progress� research. Topics are in the following areas that will form the contributing sessions and poster sessions in the workshop program: Microelectronic Device Processing and Process Integration: Trends in submicron technologies; product development (DRAM, SRAM, Flash, CMOS Imagers); new device technologies Phase Change Memory, Resistive Memory, Ferroelectric Memory, Nano-electronics), novel transistors, device improvements. MEMS and Nanoelectronic Devices Novel processes and materials, MEMS research, development and performance; nanotubes, nanowires, quantum dots, molecular devices, device characterization for nanoelectronic devices Microelectronic Device Electrical and Reliability Testing Dielectric reliability; device reliability; phase change memory reliability; novel memory technology testing schemes; electrical properties of novel devices. Semiconductor Packaging and Reliability Semiconductor package reliability, Design for Manufacturability, and stacked die packaging, and novel assembly processes. Novel packaging structures, processes, materials research, development, and performance. Microelectronic Circuit Design New product design, design techniques, and memory sensing schemes. Please submit your IEEE-formatted (up to four pages) manuscript by January 28th, 2011 to: Jaydeb Goswami, WMED-2011 Publications Chair, email: jgoswami@micron.com, phone: +1-208-368-4989. Submitted manuscripts must strictly follow the IEEE publication format guidelines. A template containing manuscript preparation instructions can be downloaded here: Download Microsoft Word Manuscript Template All accepted manuscripts will be indexed in the IEEE Xplore database. A printed proceeding of the accepted papers as well as a CD-ROM including the papers and presentations is planned and will be available at the start of the workshop. Submitted manuscripts will be limited to four pages and should follow the IEEE Electron Device Letters publication format guidelines. Manuscript Review Process Since the accepted manuscripts will be published as an IEEE publication, a rigorous peer-review process will be installed to meet the IEEE criterion for minimum standards of quality. All submissions will be rated by the technical committee based on the following standard criteria: Originality of the Work Significance and technological importance Quality of data/results and its interpretation Completeness of the manuscript Reference of the Work of Others Organization of the Manuscript Literary quality (clarity in Writing, figures, tables, etc.) Manuscript Review Process Authors of all accepted manuscripts will have an opportunity to present their work in one of the contributed sessions. If a manuscript is not accepted for publication, it will be automatically considered for the poster session. Note for Authors: The WMED organizing committee reserves the right to exclude a paper from distribution after the conference (e.g. remove it from IEEE Xplore) if the paper is not presented at the conference. This will be decided on a case by case basis where in if the committee feels that a good faith effort was not made on the part of the author to present the research at the workshop that paper may be excluded from distribution after the workshop. Questions concerning the paper content or submission process can be directed to: Prashant Raghu, Technical Chair, WMED-2011, praghu@micron.com, phone: +1-208-368-2901.

This workshop is receiving technical co-sponsorship support from the IEEE Electron Devices Society.

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