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Moore’s Law and Radiation Effects on Microelectronics
52 years ago Gordon Moore postulated
that the number of components in an integrated circuit would double every 1-2 years. Transistor dimensions have decreased from
tens of microns to 10 nanometers over this time period. In this presentation,
we will examine the effects of Moore’s Law size and voltage scaling of
transistors and integrated circuits on the vulnerability of microelectronics to
ionizing radiation effects in near-Earth space and terrestrial
applications. We will also discuss
limitations that these vulnerabilities place on future highly-scaled integrated
circuit technologies.
Daniel
M. Fleetwood
Chair
EE & CS Department, Vanderbilt University, Nashville, Tenn
IEEE
Distinguished Lecturer
Thursday
November 16, 2017
Lawrence
Berkeley Lab, Building 55, Room 117
7:30-9:30
p.m.
For
details on the talk and speaker, click here.
RSVP required. Please provide your name, affiliation,
citizenship, and birth country to Bill DeHope at dehope1@llnl.gov by Monday November 13
close-of-business. Your affiliation may be your company name,
institution, or your status as self-employed or retired.
For
directions to the meeting site and maps, click here.
Parking info specific to this meeting here.
This
site updated November 11, 2017.
Address
comments and questions to the secretary, Paul Banchero.