EMC Measurements for Information Technology Equipment
Product Compliance Using CISPR 22/24
June 2, 1998, 8:00 am to noon, at The Westin Hotel, Santa Clara
Sponsored by Don HEIRMAN Consultants

Purpose of Seminar:
To acquaint product manager, quality assurance personnel, testers, designers
and standards staff involved with product conformity assessment to
international markets of the latest measurement methods, proposed limits, and
future conformity assessment activity of the CISPR.  This seminar will focus
in some depth on CISPR EMC standards pertaining to information technology
equipment as well as other CISPR activity which applies more broadly to other
product committee activity.  This activity forms the basis of the European
Union regulatory requirements and will be included in the next versions and
updates of their EMC generic standards as well as their product specific
standards. The attendee will gain a better understanding of this activity to
apply it to his/her product line and strategies for increasing and expediting
market access internationally for those countries and regions of the world
which adopt the work of the CISPR. 

Schedule:

7:30 am 		Registration and Continental Breakfast
8:00 - 9:30 am   	Part A - CISPR 22
Latest Updates on International Emission Measurement Method Standards
CISPR 22, Third Edition (7 November 1997)
      	a.  EUT ports (including new telecom port)
      	b.  New conducted emissions on telecom ports (0.15 - 30 MHz)
		Telecom port measurement alternatives, Limits, Shielded versus
		unshielded cabling considerations
     	c.  New 40 cm tabletop conducted emission option
     	d.  New test setups for
		Table top EUTs, Floor standing EUTs, Combination table-top and
		floor standing EUTs
     	e.  New measurements above 1 GHz
		Procedure, Limits
	f.  New peak detector flow chart and decision tree
	g.  Normalized site attenuation for enclosures for emission tests
	h.  Preview of new antenna calibration procedure for emission measurements
	i.  Application of CISPR 22 to EUTs with wireless transceiving capability
	j.  Proposed common test setups with immunity testing

9:30 am		BREAK

10:00 am		Part B - CISPR 24
Latest Update on International Immunity Measurement Methods Standards
CISPR 24, First Edition (September 1997)
	a.  EUT ports
	b.  Applicable IEC standards (IEC 61000-4-X)
	c.  Application to all ITE
	d.  Limits/severity levels and special application considerations
	e.  Application to product specific EUTs
		Telecom terminal equipment (analog interface), Telecom terminal
		equipment (digital interface)
		Facsimile, Data Processing equipment including local area networks
		and printers, Copy (reproduction equipment) machines, Automatic
		Teller Machines, Point of Sale terminals
	f.  Performance degradation criteria for each EUT class
	g.  Summary sheet of document applicability
	h.  Proposed cabling layout setups for LANs
		Other proposed changes, In-situ measurements, Radiated/conducted
		CW frequency stepping transient concerns, Common test setups with
		emission measurements
	i.  EU common modification to CISPR 24

11:45 - Noon	Part C
	Question and Answer period -  Certificates of  Completion

Background of Instructor:
Don Heirman is the President of Don HEIRMAN Consultants (Lincroft, NJ) an EMC
consultation and training organization.  He has served as the principal EMC
consultant and manger of  a major EMC test laboratory in Lucent Technologies
(Bell Labs) for over  30 years before his early retirement in 1997.  He has
leadership or  key contributor roles in many national and international EMC
standards committees.  In particular, he is one of the principal contributors
(and often chief US delegate) to CISPR Subcommittee G (Information Technology
Equipment) which is the committee responsible for CISPR Publications 22 and 24
which forms the basis for this seminar.  He has been present at all of the
CISPR G meetings as well as its working groups since CISPR G was formed in the
1980’s and hence knows first hand the intricacies of the CISPR G publications
as well as future proposals for changes.

Registration Fee Includes:
Seminar notebook with non-copyrighted visuals, continental breakfast, and mid-
morning refreshments.

Hotel Information:
The Westin Hotel is located at 5101 Great America Parkway, Santa Clara,
California, phone 408.986.0700.  Guest room rates are $169.00 single
occupancy, $179.00 double occupancy, plus tax.  Room reservations must be made
by May 1, 1998 and you should mention CISPR Workshop to receive the reduced
rates.

---------------------------------------------------------------------------------
REGISTRATION FORM
(Detach and mail by May 22.  Please retain one copy for your files.)

Contact: Janet O'Neil					Check  must accompany registration.
	 Phone: 425-868-2558, Fax:  425-868-0547	
	 e-mail:  j.n.oneil@ieee.org			Make check payable to:
							Don HEIRMAN Consultants, LLC
							Send check with this completed form to:
Name: 							Janet O'Neil
							Lindgren RF Enclosures
Company:						22117 NE 10th Place
							Redmond, WA 98053
Address:						

City:		      State:           Zip:		Students are encouraged to bring a
copy of CISPR 22 					and CISPR 24 for reference purposes during the
							seminar.
Daytime Phone:					  	Copies may be ordered directly from ANSI by calling
							212.302.1286 (www.ansi.org).  Please allow 4-6 weeks
Fax:							to receive the document after order placement.

e-mail:

Workshop Registration Fees:		     	Amount

Registration postmarked by April 15		$125.00

Registration postmarked
April 15-May 15*				$150.00

Registration at the door**			$200.00

10% discount is offered to 		       (	)
Santa Clara Valley EMC
Chapter members only.
					TOTAL
*Please do not mail after May 15.
**With prior telephone or fax registration only.

The organizing committee reserves the right to substitute speakers,  modify
the program (or lecture notes), restrict  the size, or to  cancel the
workshop.  In the event the workshop is canceled, registration fees will be
refunded.  No refunds will be made to  individuals who cancel after May 1.
Substitutions are allowed.  Attendance is limited.  Registration will be
confirmed on a first received basis.