SANTA CLARA VALLEY CHAPTER OF THE IEEE EMC SOCIETY

SANTA CLARA VALLEY CHAPTER OF THE IEEE EMC SOCIETY

Spectral Lines - Febuary 2003

• Tuesday, March 11th, 2003
"Microwave and Millimeter Wave Regulation and Measurement Techniques" - Chuck Oleson

Details:
- Manufacturers producing transmitting devices operating above 30 GHz must meet FCC dictated levels for the suppression of radiated spurious and harmonic emissions. Of specific interest are the suppression criteria
encompassing the frequency range of 110 to 230 GHz. Ignoring the illogic of having regulations requiring
measurement at frequencies where no reference standards exists, some data must be produced to secure the
"certification" necessary to bring the product to market. Measurement techniques, that have been successfully used to obtain certification, are available and can be employed with reasonable effort and expense. Techniques for addressing the ISO requirement of testing the test system at these frequencies have also been developed. When approaching these
measurement tasks some mental adjustment is required on the engineer's part. These techniques and mental adjustments are discussed. The impact of recent advances in millimeter wave measurement technology will also be explored.

:: WE HAVE A NEW MEETING LOCATION... HERE IS THE MAP!

THE SOCIAL GATHERING WILL BEGIN AT 5:30pm AND THE MEETING WILL BEGIN AT 7:00pm

Meeting Place: Applied Materials Bowers Cafe,
3090 Bowers Avenue, Santa Clara, CA 5:30-8:00pm