2011 Events:

Note: The presentations are available for browsing and downloading at each linked subject title.

Date: Thursday, December 8, 2011

6:00pm: Refreshments & Social Hour
6:30pm: Technical Presentation
8:00pm: Adjourn
RSVP: brian.lee@ieee.org

Location: Agilent Technologies Main Building Aristotle Room-- the large conference room in the Main Lobby 5301 Stevens Creek BLVD Santa Clara, CA 95054

Title

Miniature Frequency-Extension Modules for Vector Network Analyzers

Speaker

Dr. Karam Noujeim, Fellow Researcher, Anritsu Company

Abstract

A detailed description of the high-frequency reflectometer technology deployed in Anritsu's Vector Network Analyzer (VNA) family will be given. It will be shown that scaling of this technology for use in the millimeter-wave range results in miniature frequency-extension modules that provide unique capabilities such as direct connection to wafer probes, dense multi-port measurements, test-port power leveling, enhanced raw directivity, and reduced measurement complexity when compared with existing solutions. These capabilities, combined with the frequency-scalable nature of the extension modules provide users with unique and compelling solutions for their current and future high-frequency measurement needs. Applications of this technology beyond traditional test and measurement will be described.

Biography

Karam M. Noujeim received the M. Eng.-I degree from McGill University, Montreal, QC, Canada, in 1990, and the M. A. Sc. and Ph.D. degrees from the University of Toronto, Toronto, ON, Canada in 1994 and 1998. From January 1990 to September 1992, he was a Member of the Scientific Staff with Bell-Northern Research (Nortel), Ottawa, ON, Canada, where he was involved with the development of computer-aided design (CAD) tools for assessing the susceptibility of printed-circuit boards to electromagnetic interference. From August 1998 to June 1999, he was a Senior Member of the Technical Staff with Stellex Microwave Systems (a divestiture of the Watkins-Johnson Company), Palo Alto, CA, where he was involved in the development of millimeter-wave components for LMDS. In June 1999, he joined the Microwave Measurements Division, Anritsu Company, Morgan Hill, CA, as a Senior Microwave Design Engineer and is currently a Fellow Engineer. From June to December 2001, he was a Visiting Academic Researcher with the High-Frequency Electronics Laboratory, University of California at Santa Barbara, where he was involved with the design, fabrication, and testing of GaAs circuits based on nonlinear transmission lines. From August 2003 to December 2004, he designed and led the prototyping of high-sensitivity micromachined thermal power sensors at the Stanford Nanofabrication Facility (SNF), Stanford, CA. He holds several patents. His current areas of interest include traveling-wave structures for use in millimeter-wave harmonic generation, sampling, reflectometry, and beam-scanning antennas; miniature frequency extenders for spectrum and vector network analyzers; high-sensitivity sensors for millimeter-wave power measurements and automotive-radar testing; and high-speed signal integrity. Dr. Noujeim is a member of the IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES Editorial Review Board, and an occasional reviewer for the IEEE Microwave Magazine and ARFTG.

Date: Saturday, October 15, 2011

9:00 am to 5:00 pm: Ubiquitous sensors in the intelligent connected world
RSVP: brian.lee@ieee.org

Location: Hyatt Regency, Santa Clara, Forum: Santa Clara Ballroom, Buffet lunch: Mezzanine

Dr. Prith Banerjee, Senior Vice President and Director of HP Laboratories, Hewlett Packard

Keynote

Pervasive sensor network in the connected

Date: Wednesday, May 18, 2011

6:00pm: Networking & Refreshments
6:30pm: Presentation
8:00pm: Adjourn
RSVP: brian.lee@ieee.org

Location: Board Room, Cogswell College, 1175 Bordeaux Drive, Sunnyvale

Title

Understanding the Impact of RF Interference: How to Find It and Fix It

Speaker

Steve Thomas, Senior Product Manager, Anritsu Company

Abstract

Interference is a growing problem. Detecting interference and finding the source of interference isn't always easy, but it must de done if effective means are to be employed to solve the problem.

This talk discusses how to identify and find interference and steps you may be able to take once the source of interference has been located.

Outline of Talk 1. Interference- A growing problem 2. Detecting Interference 3. Detecting the Interferer 4. Fixing or mitigating interference

Biography

Steve Thomas is a Senior Product Manager for the Anritsu Company in Morgan Hill. He currently works in the Field Solutions Business Unit of its Microwave Measurement Division as product manager for handheld spectrum analyzers. He has more than 30 years of varied experience in the RF and microwave instrumentation arena including work in noise figure measurement and vector network analysis. In his first job out of college he designed ECM equipment. He has spent many hours on towers installing and maintaining antenna systems at his amateur radio station, N6ST. In his home he has Wi-Fi, multiple cordless telephone systems, multiple microwave ovens, remote control cars and all sorts of other interferers.

He has run down jammers and personally taught the NFL Game Day Coordinators how to use a handheld spectrum analyzer to find interferers in stadiums during games. He is the author of numerous technical articles on the subject of interference, including an article on finding hidden transmitters. He has made multiple presentations at the IWCE trade show on the impact of interference and how to find various sorts of interfering signals.