Date: Tuesday, Jan 9, 2001

Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Conference Room 1 and 2
Complimentary Dinner 6:30PM, 7:00PM Program.

1 GHz undersampling digitizer: a case study of University/Industry Cooperation

Speakers: Dr. Rainer Fink, Texas A&M University
Mark Burns, Texas Instruments Inc.

Program Summary: In recent years, training and recruiting new analog and mixed-signal design and test engineers has become increasingly vital to the future of semiconductor manufacturers such as Texas Instruments. Recognizing the increasing importance of industry participation in the educational process, Texas Instruments has increased its efforts to take a more active role in the curriculum at several key universities throughout the U.S. and Canada. One of these target programs was initiated at Texas A&M University in College Station, Texas. In this paper, we will present a case study of a student/industry cooperative research project that resulted in a patented 1 GHz bandwidth undersampling digitizer based on a Texas Instruments Digital Signal Processor (DSP). The digitizer is fabricated on a small PC board that can be placed on a device interface board (DIB) for mixed-signal automated test equipment (ATE).

Rainer Fink was born in Speyer, West Germany in 1966. He received the BS degree in biomedical engineering (1988), the MS degree in biomedical engineering (1992), and the Ph.D. in biomedical engineering (1995) from Texas A&M University. After finishing his Ph.D., he was a lecturer in the Bioengineering Program and the Department of Engineering Technology at Texas A&M University. In August 1996, he joined the Electronics Engineering Technology faculty at Texas A&M University. His research activities include mixed-signal testing, analog circuit design and biomedical electronics.

Mark Burns received his BSEE from MIT in 1984. He began his career in mixed-signal testing as an applications engineer at LTX corporation in Boston, MA. In 1988, Mark joined Texas Instruments as a test engineer in the mixed-signal products department. Mark developed test programs and test hardware for a variety of devices, including video palettes, central office codecs and SLICs, multimedia audio devices, general purpose ADC and DAC converters, and cellular telephone baseband modulators. Mark recently joined the baseband design organization to explore mixed-signal Design for Test (DfT) concepts. Mark is the principle author of the book , "An Introduction to Mixed-Signal IC Test and measurement"

For a copy of the trasparencies click here (almost 1M)

For any further information please contact:

M.Burns

Texas Instruments Inc.
Dallas, TX 75243
email:mburns@ti.com


Date: Monday, Feb 19, 2001

Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Conference Room 1 and 2
Complimentary Dinner 6:30PM, 7:00PM Program.

Curvature Compensated BiCMOS Bandgap with 1 V Supply Voltage

Speaker: Dr.Franco Maloberti, IEEE Fellow, Texas A&M University

Summary: Supply voltage is scaling down because of reducing oxide thickness and increasing demand for low power portable equipment. Soon circuits operating with 1.2 V (+/- 10%) or less will be brought in the market. The threshold voltage of MOS transistors, however, is not scaling down as much as the supply voltage. Therefore, this relatively high threshold calls for new techniques in the design of basic analog blocks. The seminar, after the introductory discussion on the issue, presents a non-conventional architecture for bandgap voltage generation. Typical structures allow us to achieve a reference voltage of about 1.2 V with minimum sensitivity to temperature variation. The circuit solution discussed here permits to generate a reference voltage of 0.54 V while using a supply voltage of 1 V and dissipating 92 uW at room temperature. The circuit is implemented in a submicron BiCMOS technology. The bandgap circuit incorporates a 1 V non-conventional operational amplifier, which achieves virtually zero systematic. Moreover, the bandgap allows a straightforward implementation of the curvature compensation method. Experimental results show 7.5 ppm / K of temperature coefficient and 212 ppm / V of supply voltage dependence

Dr. Maloberti received the Laurea Degree in Physics (Summa cum Laude) from the University of Parma in 1968 and the Doctorate Honoris Causa in electronics from the Instituto Nacional de Astrofisica, Optica y Electronica (Inaoe), Puebla, Mexico in 1996. He joined the University of L'Aquila, then the University of Pavia. In 1993 he was a Visiting Professor at ETH-PEL, Zurich working on electronic interfaces for sensor systems. Dr. Maloberti also served the European Commission as ESPRIT projects' evaluator and reviewer. He served the Academy of Finland (1996) and the National Science Foundation of Portugal (1999) in the assessment of electronic research. His professional expertise is in the design, analysis and characterisation of integrated circuits and analogue digital applications, mainly in the areas of switched capacitor circuits, data converters, interfaces for telecommunication and sensor systems, CAD for analogue and mixed A-D design.
Dr. Maloberti has written more than 240 published papers, two books and holds 15 patents. He was in 1992 recipient of the XII Pedriali Prize for his technical and scientific contributions to national industrial production. He was co-recipient of the 1996 Institution of Electrical Engineers (U.K.) Fleming Premium. He received the 1999 IEEE CAS Society Meritorious Service Award and the 1999 CAS Society Golden Jubilee Medal. He was an Associate Editor for the IEEE Trans. on Circuit and System (Part II). He is a former IEEE CAS Vice President-Region 8. He is the President-Elect of the IEEE Sensor Council. He is a member of the Italian Electrical Engineering Association (AEI) and a Fellow of IEEE.

For a copy of the trasparencies click here (almost 180K)

For any further information please contact:

Dr.Franco Maloberti

Dept. of Electrical Engineer
Analog and Mixed-Signal Center
Texas A&M University
College Station, TX 77843
email:franco@ee.tamu.edu


Date: Thursday, May 10, 2001

The Forum of the Hughes-Trigg Student Center of the Southern Methodist University (SMU).
3140 Dyer Street
Dallas, TX 75205-1977
Complimentary Dinner 6:30PM, 7:00PM Program.

For more detailed maps of the SMU campus click here. The Student Center is the the bulding 37 (purple colour) in the center of the map.

Design for Testability of Mixed-Signal Circuits

Speaker: Dr. Gordon Roberts, McGill University, Montreal, Canada

Summary: The talk describes the concept of design-for-test (DFT) as it applies to mixed-signal circuits. In particular, this section will discuss defect-oriented testing methods and the role of fault modeling and simulation. Subsequently, this section will demonstrate how analog testability can be improved by the inclusion of test buses and probe points, as well other, more powerful test structures, such as on-chip signal generators and parameter extraction circuits. We shall also describe BIST schemes for analog-to-digital converters, CODECs, transcievers and PLLs. Some time will also be devoted to an overview of the IEEE 1149.4 test bus.

Gordon W. Roberts received the B.A.Sc. degree from the University of Waterloo, Canada, in 1983 and the M.A.Sc. and Ph.D. degrees from the University of Toronto, Canada, in 1986 and 1989, respectively, all in Electrical Engineering. He is currently an Associate Professor in the Department of Electrical and Computer Engineering, and the director of the Microelectronics and Computer Systems Laboratory, both at McGill University, Montreal, Canada. Over the years, he has conducted extensive research on analog integrated circuit design and mixed-signal test, and has contributed nine chapters to books. Dr. Roberts is a past Associate Editor of the IEEE Transactions on Circuits and Systems - Part II and an Associate Editor for the IEEE Design and Test of Computers Magazine. He is presently a distinguished lecturer for the IEEE Computer Society and the IEEE Circuits and System Society. He has received numerous department and faculty awards for teaching electronics to undergraduates, and several IEEE award for mixed-signal testing.

For a copy of the trasparencies click here (almost 1.75M)

For any further information please contact:

Dr.Gordon Roberts

Department of Electrical Engineering
McGill University
3480 University Street
Montreal, PQ, Canada H3A 2A7
email:roberts@macs.ece.mcgill.ca


Date:16th July 2001

TI Auditorium, Texas Instruments Inc., South Lobby
8505 Forest Lane, Dallas
Complimentary Snack 11:30AM, 12:00 (noon) Program.

Digitally Corrected Delta-Sigma Data Converters

Speaker: Dr. Gabor Temes, Life Fellow IEEE, Oregon State University University, Cornvallis, Oregon

Summary: Delta-sigma data converters are among the key components of modern digital communication systems. While they are relatively insensitive to analog component accuracy, there are very important situations where their design goals cannot be achieved without additional calibration or correction procedures. These may occur for the cascade or MASH structures, where high resolution is achieved by canceling a large quantization noise using both analog and digital components, requiring extreme accuracy from the former ones, or in the design of high-frequency multibit-quantizer converters which need D/A converters with impractical linearity requirements.

In this lecture, some recent results will described for the algorithms and implementation of both digital and analog correction techniques in multibit delta-sigma converters.

Gabor C. Temes received the undergraduate degree from the Technical University and Eotvos University, Budapest, Hungary, from 1948 to 1956, and the Ph.D. degree in electrical engineering from the University of Ottawa, Canada, in 1961. He received the Honorary Doctorate from the Technical University of Budapest in 1991.

He held academic positions at the Technical University of Budapest, Stanford University, and at UCLA, and worked in industry at Northern Electric R&D Laboratories (now Bell-Northern Research) and Ampex Corporation. He is now a Professor in the department of Electrical and Computer Engineering, Oregon State University (OSU), Cornvallis, OR. He served as the Department Head at both UCLA and OSU. He is co-editor and co-author of Modern Filter Theory and Design (New York, Wiley, 1973), co-author of Introduction to Circuit Synthesis and Design (New York, McGraw-Hill, 1977), co-author of Analog MOS Integrated Circuits for Signal Processing (New York, Wiley, 1986), and co-editor and co-author of both Oversampling Delta-Sigma Data Converters (Piscataway, NJ, IEEE Press, 1992) and Delta-Sigma Data Converters (Piscataway, NJ, IEEE Press, 1997). He is contributor to several other edited volumes, and has published approximately 300 papers in engineering journals and conference proceedings. His recent research has dealt with CMOS analog integrated circuits, as well as data converters and integrated sensor interfaces.

Dr. Temes was an Associate Editor of the Journal of the Franklin Institute, Editor of the IEEE Transactions on Circuit Theory, and Vice President of the IEEE Circuits and Systems Society. He was co-recipient if the CAS Darlington Award in 1968 and 1981, and winner of the Centennial Medal of the IEEE in 1984. He received the Andrew Chi Prize Award of the IEEE Instrumentation and Measurement Society in 1985, the Education Award of the IEEE CAS Society in 1987, the CAS Technical Achievement Award in 1989, the IEEE Graduate Teaching Award in 1998, and the IEEE Millennium Medal and the IEEE CAS Golden Jubilee Medal in 2000.

Most of the contents of this talk can be found in the following literature

ON ADAPTIVE DIGITAL CORRECTION:


ON DAC LINEARITY:


ON DELTA-SIGMA LINEARITY:




Date: Tuesday, October 30, 2001

Dallas Texins Association at Texas Instruments 13900 N Central Expwy.
(north-bound access road between Midpark Rd. & Spring Valley Rd.)
Conference Room 1&2
Complimentary Dinner 6:30PM, 7:00PM Program.

Segmentation Matching and Linearity in Data Converters

Speaker: Paul Fontaine, Texas Instruments Inc.

Program Summary: Nyquist Rate data converters rely on the accurate ratio of devices to convert signals between analog and digital domains. Mismatch is thus a major source of non-linearities in this type of converters, and being aware of its cause and effect is of major importance. In this presentation, the author will review the fundamentals of data converters, device mismatch, segmentation, and their impacts on linearity.Then, different implementations of resistors string DACs and successive approximation ADCs will showthe various trade-offs offered to the designer, and the path toward an optimal solution.

Paul A. Fontaine received the M.S.E.E. degree from ISEN (Superior Institute of Electronic of the North), Lille, France, in 1994. During 1995-96, he was an Assistant Professor at ISEN, and a Research Assistant at the CNRS (National Center of Scientific Research), where he started a PhD thesis in Nanoelectronics. Since 1998, he has been with Texas Instruments Incorporated, Dallas, TX, as an IC Design Engineer in the Mixed-Signal Design Department, currently with the Analog Baseband Design Branch.

For a copy of the trasparencies click here (almost 780K)

For any further information please contact:

Paul Fontaine

Texas Instruments Inc.
P.O.Box 660199, MS 8729
Dallas, TX 75243
email:p-fontaine1@ti.com