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| Newsletter Editor Janet O’Neil
is shown with speakers from the “Advanced Topics for
Antennas and Field Probes in Radiated Measurements”
tutorial held during EMC 2008. Speakers included (from left)
Alexander Kriz of the Austrian Research Center, Mike Windler
from UL, Zhong Chen and Vince Rodriguez from ETS-Lindgren
and Dennis Camell of NIST. |
Another Busy Symposium
in Detroit!
Hats off to Kimball Williams and committee for organizing another
great symposium - this year in Detroit. The 2008 IEEE International
Symposium on EMC had something for everyone and a unique gala
that will be talked about for years. Who knew we had such energetic
dancers in the EMC Society?
One of the reasons I selected the above photo for this issue is
that it showcases my greatest interest in the annual EMC Symposium
– the technical program! I enjoy collaborating with the
industry experts and in Detroit I had the opportunity to co-chair
two new tutorials. It gave me an appreciation for all the speakers
and the time it takes to put together a good presentation, not
to mention an entire session. How does the technical program committee
coordinate all the paper reviews – not to mention second
rounds of reviews on occasion – assign papers, schedule
rooms, publish CDs, keep track of copyright forms, etc.?
There is so much work that goes into putting together a quality
technical program for a major symposium. I offer my humble appreciation
to those involved in the Technical Program at EMC 2008 –
including Mark Steffka, Tom Jerse, Bruce Archambeault, John Maas,
Keith Frazier, Scott Mee, Kin Moy, Tom Holmes, Candace Suriano,
Bogdan Adamczyk, Rich Wiese, Flavio Canavero, Don Heirman, Bob
Scully, John Norgard….and I’m sure there were many
other people behind the scenes contributing to the success of
the technical program! To all involved, kudos for your success!
Back to the above photo; note you can get a glimpse of the crowd
at the technical sessions. The aisles outside the meeting rooms
were very busy during the breaks in the technical presentations.
I liked that “buzz” of seasoned and novice EMC practitioners
exchanging notes, debating techniques, postulating new theories
and questioning old ones. We wouldn’t have seen that “buzz”
if the technical program hadn’t generated discussion. Again,
thanks to all involved in putting together a memorable technical
program.
I hope you enjoy this issue and the coverage of activity at EMC
2008. From the photos on the following pages, I’m sure you
can tell those who attended had an enjoyable time. With the great
social events, companion tours, hotel arrangements, exhibit hall
activity and more, EMC 2008 will be a symposium to remember! EMC
