Chapter Chatter

Who Are You Guys, and Why Can’t I Open My Store?
The following is an excerpt from a compilation of EMC stories presented several years ago at a Seattle EMC Chapter meeting by Patrick André of André Consulting, Inc. “A new grocery store had been opened in St. Louis, MO. This new “high-tech” (now normal) store included the installation of 15 scanning checkout stands with customer enunciator panels. A week before the big grand opening, store management turned on the new checkout stands to verify their functionality. The function tests carried on the rest of that day and into the next. However, the next morning, a group of men walked in carrying radios and red tags. The checkout stands were red tagged and turned off. The men left. The late Chris Kendall (CKC Laboratories) was called in as an EMC consultant to find out what was happening and to fix the problem. Chris went to work and found the problem right away. The enunciator panels had a display driver at the bottom of the display. The connector to the display was at the top of the display and there were 5 MHz data lines running around one side of the panel and then returned on the other side of the panel. The men who arrived were, of course, from the FCC. They were upset because a local repeater was being jammed (at about 110 MHz). The fix introduced by Chris was to tie a wire to the ground path and lay the wire on top of the clock traces as an image return. Once this was done, the interference problem went away, the red tags were removed and the store opened. The lesson? Remember Mary and her little lamb... everywhere the signal goes, its ground is sure to follow.”

Welcome New Chapter!
Victoria (Australia)
Please welcome the newly founded Victoria IEEE EMC Chapter in Australia! The EMC Society Board of Directors, Chapters, and Members welcome the new Chapter. The Chairman of the new Victoria IEEE EMC Chapter in Australia is Malcolm Mulcare. He can be reached at malmulcare@pacific.net.au
Austria
Over 80 people participated in the “4th Austrian IEEE EMC Symposium” organized by the Austrian EMC Chapter together with the Institute for Electronics of the Graz University of Technology and the Austrian Electro- technical Association (OVE) in cooperation with the Research Institute for Integrated Circuits of the Johannes Kepler University Linz. The one-day event took place at the campus of ARC Seibersdorf Research, which is the largest contract research enterprise in Austria. It was sponsored by Würth Electronics, Rohde & Schwarz, UEI and publish-industry publishing company. At the Symposium, nine speakers presented their research activities and talked about many different topics like nuclear electromagnetic pulse, EMC at the chip-level, EMC problems caused by cables, anechoic chamber validation, EMC filters, measurement uncertainties etc. During the lunch break and after the presentations, the audience had the opportunity to discuss and to visit a small exhibition. Following the presentations, attendees were able to visit the Seibersdorf EMC Test Lab. It was a great event and very much appreciated by the attendees. More photographs of the “4th Austrian IEEE EMC Symposium” can be found at our web page: www.smart-systems.at/Fachtagung2006. In 2007, the Austrian IEEE EMC Symposium will take place at the Graz University of Technology.

Participants of the Austrian EMC Symposium 2006 await the beginning of one of the first technical presentations.

Participants of the Austrian EMC Symposium 2006 enjoy the break in front of the building.

Dr. Deutschmann and Dr. Winkler during their talk at the Austrian EMC Symposium 2006.

Central New England
On June 21, 2006 the Central New England Chapter of the EMC Society sponsored a “Boston Tech Tour EMC Seminar” at the Westford Regency Inn and Conference Center, Westford, Massachusetts. The event was attended by over 60 technical professionals involved in the EMC technology field. The half-day event consisted of a three part technical seminar. The goal of the seminar presentations was to provide practical information for the EMC engineer, designer or technician to actually use on the job! Following the technical seminar, a reception with the speakers was held at the hotel. Participants were able to meet with the speakers and view hands on demonstrations that were designed to “drive home” the material presented. A door prize drawing was held at the conclusion of the reception. Those who completed a survey form (provided) at the end of the event received a ticket to enter the drawing for door prizes. The first paper covered “Lab RF Cables, Connectors, and Accessories Using eBay and a Test Receiver” by Lee Hill of SILENT. Many EMC engineers and technicians have and are familiar with using a spectrum analyzer with a tracking generator. This presentation gave a hands-on demonstration of how to create a very sensitive, low cost measurement system for characterizing the performance of RF devices found in most EMC troubleshooting and test laboratories. There was a short tutorial on the advantages, disadvantages and best use of insertion loss and return loss measurements. Lee Hill is Founding Partner of SILENT, a private consulting firm established in 1992 that specializes in design for EMC, EMC troubleshooting, RF design and training. Previously Lee was Principal EMC and Systems Engineer at Digital Equipment Corporation’s Workstation Systems Engineering Group in Palo Alto. Lee has over 20 years of experience in the EM design and retrofit of complex electronic systems. He has been teaching short courses on EMC design and troubleshooting for 13 years. Lee received the Master of Science Degree in Electrical Engineering and Electromagnetics with highest honors from the University of Missouri-Rolla (UMR). The next speaker was James Young of Rohde & Schwarz who presented a paper entitled, “Improving the Accuracy of EMI Measurements.” Topics covered by James’ paper included “The Spectrum Analyzer versus The EMI Receiver (Advantages and Disadvantages).” He also covered the problems and benefits of using low noise amplifiers for increased sensitivity. James Young is the sales and marketing manager for Rohde & Schwarz EMI products in the Americas. His engineering background includes system, circuit, ASIC and FPGA design for various communication products. He has also held product management and marketing positions with Cadence (Tality) in San Jose, CA, Parker Vision in Jacksonville, FL and Signal Space Design in Salt Lake City, UT. He holds a BSEET from Weber State University and an MBA from the University of Phoenix. The third speaker, Zhong Chen of ETS-Lindgren, presented “Applications of Field Probes for Efficient EMC Measurements.” This presentation covered the important parameters of electromagnetic field probes for effective EMC measurements, how to select field probes for the specific applications, using calibrations to improve measurement uncertainties, and how to avoid pitfalls in radiated immunity measurements. Zhong Chen is a senior principal design engineer at ETS-Lindgren in the field sensing devices group. He received his M.S.E.E. degree in electromagnetics from Ohio State University in Columbus, Ohio.

An audience of more than 60 in attendance enjoys the June EMC Tech Tour hosted by the Central New England Chapter.

James Young of Rohde & Schwarz presenting his paper to the Central New England Chapter in June.

Sharon Smith (left) and Alexis Harrington (right) from Conformity Magazine, and Tammy Hojat of ETS-Lindgren (center) enjoy a few moments together at the June EMC Tech Tour hosted by ETS-Lindgren, Rohde & Schwarz, and Conformity Magazine for the Central New England Chapter.

Lee Hill of SILENT (second from right) provided a demonstration for the Central New England Chapter following his presentation at the June Tech Tour.

Zhong Chen of ETS-Lindgren presenting his paper at the June Tech Tour in Boston.

Chicago
In February, Bob Hofmann of Hofmann EMC Engineering presented the status of ANSI IEEE C63.5-2006, which is the standard for calibration of EMC antennas. His presentation covered the various calibration methods, i.e. standard site method, reference antenna method, and equivalent capacitance substitution method. He also presented information on the most recent document revision and the significance of the updates to EMC testing. In March, Roy Leventhal of Leventhal Design & Communications spoke to the Chapter attendees on EMC simulation through computer modeling. Roy gave a step-by-step review of how various levels of simplification are applied to transistor level physical models. He also demonstrated how to achieve the best speed versus accuracy trade-off of simplicity versus detail. The session concluded with a brief introduction to the Cadence Design Systems macro-modeling templates. The April meeting featured a presentation on Motorola’s Improved Broadband Over Power Lines (BPL). Dick Illman of Motorola’s Enterprise Mobility Solutions gave the technical presentation. Mr. Illman described Motorola’s BPL enhancement, which reduces RF interference to and from infrastructure and does not use the medium voltage power lines as a radiating element. He identified the EMC issues and measurements associated with the implementation of BPL. The Chicago Chapter concluded its technical presentation season with the Annual Chicago EMC Mini-Symposium. This was the 8th consecutive year of the event and featured keynote lecturer Lee Hill of Silent. Lee’s topic, “What Your Mother Never Told You About Ferrites” was fast paced and informative for the audience, which included over 75 attendees. The Mini-Symposium also featured technical presentations from Tom Braxton who lectured on Fundamentals of EMC and Mr. Jason Smith of AR Worldwide who presented the changes in the immunity standard IEC 61000-4-3. Lastly, Jack Black of DLS Electronics spoke to attendees on RoHS compliance and Ray Klouda of Elite Electronic Engineering concluded the event with an open forum discussion on common EMC measurement problems. The Chicago Chapter proudly announced it has established an annual scholarship funded by the honorarium it received as the host committee for the 2005 IEEE EMC Symposium. The scholarship will be awarded to a student selected from an electrical engineering or physics program that is a member of the IEEE and has demonstrated an interest in EMC or signal integrity. Finally, at the Mini-Symposium the Chicago members recognized Ms. Carla Robinson for her many years of enthusiastic dedication to the Chapter. Carla recently announced her plans for marriage, which will also include relocation to southern Illinois. We are all extremely happy for her but will certainly miss her cheerful spirit and friendship.

Dick Illman of Motorola during his April presentation on advancements in BPL to the Chicago Chapter.

Jack Black of DLS Electronics recognizes Carla Robinson for her outstanding service to the Chicago Chapter at their recent Mini-Symposium.

Germany
On May 16, the German Chapter welcomed the participants of the Region 8 workshop on computational electromagnetic (CEM) computer modeling at the Hamburg University of Technology, Hamburg, Germany. The workshop included a number of well-known speakers and the President of the EMC Society. The attendees, which included 35 scientists and engineers from industry, government agencies, research institutes and academics were welcomed by the technical program chair of the workshop, Frank Sabath. In his opening address, Mr. Sabath told the workshop participants that the IEEE German EMC Chapter wanted to express its gratitude to Herman Singer and to honor his technical achievement. Herman Singer has investigated CEM computational methods for three decades. During this time and due to his outstanding dedication to his profession as professor and engineer, he was able to establish his institute as one of the top competence centers on CEM computer modeling in Europe. All six speakers delivered presentations of interest and high quality. The topics spanned from a survey of CEM modeling and new developments in the area of CEM modeling to validation techniques and standardization efforts. The participants provided immediate feed back with a large number of questions and discussions. Even during coffee breaks and lunch time, technical discussions did not stop. As a result, all participants agreed that the technical content was well worth the effort.

Host and speakers of the Region 8 workshop on CEM computer modeling, from left: Herman Singer, Andy Drozd, Bruce Archambeault, Ulrich Jakobus, Heinz Brüns, Marko Leone, and Frank Sabath.

Attendees of the Region 8 workshop on CEM computer modeling.

Discussions at the German EMC workshop continued during coffee breaks.

Herman Singer gladly accepts good wishes for his retirement.

Malaysia
The IEEE AP/MTT/EMC Joint Chapter of Malaysia held a one-day training on CST Microwave Studio Software, a specialist tool for 3D EM simulation of high frequency problems. Dr. Linus Lau from CST Malaysia conducted the training on June 1, 2006 at the Microwave Technology Centre, Universiti Teknologi MARA, Shah Alam. There were a total of 15 participants. The Malaysia Chapter will be hosting the International RF and Microwave Conference (RFM2006) 12 – 14 September 2006 at the Palm Garden Hotel, Putrajaya, Malaysia. RFM2006 is a biannual Chapter event aimed to provide opportunities for researchers, engineers and industrialists working in areas related to RF and microwave to present research results and new findings. It also aims to foster a close academia-industry relationship and serves as a platform to discuss areas of mutual interest among attendees. More than 75 paper abstracts from 20 participating institutions and industries of 10 countries have been received. Other planned events include a one-day tutorial, conference opening ceremony, plenary session, technical sessions and industrial exhibition. Details of the conference can be obtained from the conference website at www.uitm.edu.my/mtc/.

Phoenix
Glen Gassaway reports that the featured speaker in March was Dr. Franz Schlagenhaufer of the Western Australian Telecommunications Research Institute (WATRI). The meeting began with the customary social hour starting at 6 pm. After attendees had their fill of Garcia’s great Mexican food, Harry Gaul, the Chapter chairman, called the meeting to order at 7:00 pm. It was immediately apparent that they had another excellent turn out, with over 20 persons attending, including one person from Tucson. Dr. Schlagenhaufer told the Phoenix Chapter that numerical field simulation is a useful tool for achieving electromagnetic compatibility on a system level. Numerical field simulation results may not have extreme accuracy on complex system models (as may be necessary for precise RF models), but generally EMC problems do not require that level of accuracy. During the simulation process, it is important to neglect as many unimportant details as possible to speed up the simulation, while keeping essential details. Therefore, performing meaningful simulations can be somewhat of an art form. System simulations are not meant to replace actual measurements, but are very useful in providing problem insight, supporting problem solving, and predicting the responses of design modifications. Situations when numerical simulations should be performed include: a) when the product is not available (such as shipboard antenna structures), b) when controlled variations of parameters are not possible (such as lightning strikes on transmission lines) and c) when the physical value of interest is not easily obtainable (such as the inductance value of complex structures). Dr. Schlagenhaufer’s presentation addressed the five basic steps of a typical simulation procedure: Modeling, Meshing, Computation, Result Validation, and Post-Processing Routines. Modeling includes transforming the physical model into a mathematical one. It is important to simplify and neglect non-essential parts of the physical model. It is important to know if the modeling assumptions are reasonable, and if adequate computer resources are available. Meshing includes converting the model into something the computer can understand. Segment sizes should be based on wavelength and structural discontinuities. The program itself generally does computation. Presently available software is usually very accurate, but the output is only as good as the model. Before attempting the computation process, it is important to estimate calculation time and computer resource requirements. Result validation is often done by reviewing boundary conditions, power budget, field and current distributions and the model’s sensitivity of the variation of input data. Post-processing is required to display the results in a meaningful manner. Perhaps the best data display could be a set of observation points versus frequency, an observation line, or an observation plane. Combinations of these or other displays may also be meaningful. Dr. Schlagenhaufer closed the presentation with the following remarks: When it comes to field simulation for complex systems, some particularities can be noted. The outcome from the simulations will, in most cases, not be the final result, but rather the simulation results will be the input data for further systems analysis. After the presentation, Harry Gaul presented Dr. Schlagenhaufer with a beautiful Arizona Highways Calendar for his efforts. The Phoenix Chapter thanks Dr. Schlagenhaufer for a very interesting lecture! Information on future meetings is available on the Phoenix EMC Chapter Web site at https://www.ewh.ieee.org/r6/phoenix/phoenixemc/.

In his talk on electromagnetic modeling, Dr. Franz Schlagenhaufer explains to the Phoenix Chapter the need to increase the mesh density near edges where the current is rapidly changing.

Harry Gaul (right) presents Glen Gassaway with an appreciation award from the Phoenix Section for his contributions to the operation of the Phoenix EMC Chapter in 2005.

Pittsburgh
The second meeting of the newly formed Pittsburgh EMC Society Chapter was held on Thursday, May 11 at the Westinghouse Energy Center in Monroeville, PA. Michael Oliver, IEEE EMCS Chapter Chair hosted the meeting. The meeting started with a social prior to a technical presentation. We had the privilege of having Harry Godlewski as our technical speaker; Harry is the Vice Chairman of the IEEE EMC Chapter. The meeting had 15 attendees. Discussions at the meeting encompassed the upcoming technical presentations agenda and an introduction of Harry Godlewski. The technical presentation by Mr. Godlewski titled “EMC: An Overview” presented the historical origins and the driving interest in EMC. Reviews of the impact of EMC engineering from component level, intra-system to inter-systems were also discussed. In addition, various modes of interference were presented. Methods and approaches available for mitigation and prevention of electromagnetic interference (EMI) were summarized. In conclusion, an overview of the various guidance/compliance documents that are available and some field examples of EMI investigation were presented. Mr. Godlewski, currently employed by Nu-Metrics, has over two decades of experience with RF systems, electromagnetic radiating systems, and electromagnetic compatibility issues. His experience encompasses work through and with firms involved in strictly commercial applications as well as with defense systems. He holds a BSEE from the University of Pittsburgh and an MSEE from Northeastern University in Massachusetts. He is a professionally registered engineer and a Certified Electromagnetic Compatibility Engineer (certified by the National Association of Radio and Telecommunications Engineers).

Harry Godlewski during his May EMC overview presentation to the newly formed Pittsburgh Chapter.

Harry Godlewski (right) recieves much deserved recognition and thanks for his May presentation to the Pittburgh Chapter.

Seattle
In May, CKC Laboratories sponsored a special afternoon session with three excellent speakers. First to speak was Leo Makowski, President of HV Technologies. Mr. Makowski spoke on the latest lightning test requirements and test techniques. During the day, Mr. Makowski was able to demonstrate HV Technologies Multiple Burst / Multiple Stroke Lighting Test Equipment which was recently installed at CKC Laboratories’ new Bothell, Washington facility. Following Mr. Makowski, attendees were treated to an excellent catered lunch, courtesy of CKC Laboratories. After the lunch break, which included tours of CKC’s new test facilities, Mr. Ralph Trefney of Science Works Company spoke on “How to Pass EMC Testing: A Brief Guide to Avoiding the Common Causes of Failure.” Mr. Trefney is a highly experienced, NARTE certified, independent consultant in the Seattle area. With his extensive background in commercial, aerospace, military, and RF electronics, Mr. Trefney’s talk was filled with practical experience, common design errors, and proper methods to avoid problems during testing. The final speaker was Mr. Brent DeWitt. Mr. DeWitt is an independent consultant in the Seattle area specializing in medical standards and design. His talk, “At the Crossroads of Safety and Performance: Future Paths for Medical EMC Standards,” was based on his intimate knowledge of the subject. Mr. DeWitt represents the United States on SC 62A WG-13, the committee that wrote and maintains the Medical EMC Standard IEC 60601-1-2. In addition, Mr. DeWitt serves as the vice chairman of the Seattle EMC Chapter. Attendees at the special May Seattle meeting were also treated to a drawing for three each, $100 gift certificates to Best Buy, courtesy of Panashield, Inc. The happy and enthusiastic winners were Jim Robsen of Zetron, Farzad Keshvadian of Boeing, and Holland Guldberg of UASC.

Leo Makowski of HV Technologies gives an excellent presentation on the latest lightning test requirements and techniques to the Seattle Chapter in May.

Attendees at the Seattle May meeting enjoy an excellent catered lunch, courtesy of CKC Laboratories.

Many of those who attended the Seattle May meeting enjoyed eating their lunch outdoors on CKC’s covered loading dock.

Ralph Trefney (far right) discusses avoiding common EMI failures with an enthusiastic crowd at Seattle’s May meeting.

Brent DeWitt spoke at the Seattle EMC Chapter “Triple-Header” half day meeting in May.

Southeast Michigan
On January 30-31, the Chapter held a two-day workshop on Automotive EMC Standards at the University of Michigan at Dearborn’s Fairlane Center. It was held immediately following the week-long series of meetings of the ISO automotive EMC committee held at the SAE headquarters in Troy, Michigan. As such, it attracted attendance from all over the world. Poul Andersen started the first day noting that the workshop would address automotive related EMC topics in such standards issued by CISPR, ISO, and the SAE. Agenda topics covered standards activity related to ESD, emissions, immunity, transients, and alternative methods. There were also presentations on integrated circuits (per IEC and SAE standards) and hybrid GM/DCX EV testing. The “Big Three” were represented with presentations by GM’s Don Seyerle, Ford’s Keith Frazier, and DaimlerChrysler’s Terry North and Andrew Shune. Nissan’s Hitoshi Tsukahara also presented. The workshop concluded with presentations from various professional organizations such as NARTE and A2LA. Phil Fanson addressed AEMCLRP accreditation experiences. It had been two years since this standards workshop had been held and all agreed the new developments were very interesting to hear. “Electromagnetic Computational Modeling for Real-World Engineering Problems” was the title of the brilliant presentation by Dr. Bruce Archambeault for Southeastern Michigan’s EMC Fest held on May 2. Dr. Archambeault went carefully over the various computational methods used in evaluating electromagnetic conundrums. Participants went home with valuable knowledge that could be used in choosing new analysis packages. Over 80 people attended this one-day colloquium and exhibition. For more information on the activities of this very active Chapter, visit their website at www.emcsociety.org.

Scott Lytle of Yazaki North America, Kimball Williams of Denso International America Inc., Matt Feusse of Yazaki North America, speaker Dr. Bruce Archambeault of IBM, Dr. Candace Suriano of Suriano Solutions and Robert Kado of DaimlerChrysler (from left) at the SE Michigan’s annual EMC Fest event.

Kin Moy (left) and Poul Andersen get material ready for the start of a two-day workshop organized by the SE Michigan Chapter on Automotive EMC Standards.

Russ Carstensen of NARTE (left) prepares his tabletop display as Kimball Williams of Denso International America looks on.

Washington DC/ Northern Virginia
Mike Violette of Washington Labs reports that on April 25, the Chapter featured a “Tech Tour” half-day seminar hosted by ETS-Lindgren, Rohde & Schwarz, and Conformity Magazine at the Sheraton Columbia Hotel in Columbia, Maryland. Guest speakers included leading industry experts, Blaise Corbett of the Naval Surface Warfare Center, Dahlgren, Virginia, Vince Rodriguez of ETS-Lindgren, and Vic Hudson of Rohde & Schwarz. Some 30 people attended and enjoyed hearing the presentation titled “Reverberation Chambers: A Statistical Approach For Conducting Cost-Effective System Electromagnetic Vulnerability Assessments” by Mr. Corbett. He explained that reverberation chambers are emerging as an alternative test facility for EM/EMC measurements. Long a main stay test technique in the automotive and military industries, reverberation chambers are currently used for a wide range of measurement applications such as radiated immunity of components and large systems, radiated emissions, shielding characterizations of cables, connectors and material, to name a few. Mr. Corbett addressed these topics as well as reviewed EM measurements in complex cavities and reverberation chambers. This was followed by a presentation titled “Anechoic Chamber Solutions for Antenna Pattern Measurements” by Vince Rodriguez. Dr. Rodriguez introduced the user to antenna ranges, and concentrated on rectangular and taper anechoic chambers for APM. Absorber technology, Quiet Zone levels, and far field requirements were discussed as well as the proper absorber treatment for both taper and rectangular chambers. The final presentation was titled “Improving the Accuracy of EMI Emissions Testing” by Vic Hudson, Rohde & Schwarz. Mr. Hudson explained why EMI measurements require a different approach than other types of general RF tests. In EMI, engineers never quite know what signals may be present. Knowing the strengths and weaknesses of the tools being used is vital. Two instruments are used for EMI testing, spectrum analyzers and test receivers. Each requires a different approach to the test, and each has advantages and disadvantages. Mr. Hudson’s presentation explored and compared both instruments. Other related topics presented included “Common Misunderstandings and Mistakes” when performing and designing test systems for EMI measurements. The seminar concluded with a reception with the speakers where refreshments were served and a door prize drawing was held. This provided a great opportunity to network with the speakers and view demonstrations of the material presented. On June 22, the Washington DC/Northern Virginia Chapter held its Chapter meeting at the Bell Labs Network Reliability and Security Office (*wow*) on New York Avenue in Washington DC. “ZAP! Washington Gets Hit By Lightning. No Lawyers Reported as Injured!” Leo Makowski, President of HV Technologies, provided a detailed look at the new RTCA DO-160 Lightning Testing requirements. Improved characterization of multi-strike and multi-burst lightning phenomena have led to a better understanding of the test conditions necessary to simulate these events. The box-level, or Field Replaceable Unit (FRU), testing specify pin and bulk current injection requirements. The objective is to improve subsystem reliability. Testing to these lightning events is increasingly necessary as more airframe manufacturers move to composite airframe structures in the quest to decrease weight and improve fuel efficiency. In the past, the aluminum skin of airplanes provided an excellent Faraday shield to lightning strikes; while airframe designers employ metalization in composite structures to improve conductivity and maintain shielding, two factors increase potential system vulnerabilities: an overall lower conductivity increases “leakage” through aircraft skin and more flight electronics, wiring, and cabling increase the number of potential vulnerabilities. To mitigate threats and effectively meet the design challenges, an understanding of the waveforms and the test methodologies is necessary. Mr. Makowski provided the gathered group with a detailed explanation of the evolving requirements as well as test solutions for meeting the DO-160 lightning requirements. As the thunderstorm season revs up, anyone who flies should be grateful for the diligent efforts of those involved in the design, testing, and reliability of those funny boxes with wires that are buried under the skin of every airplane. The meeting was hosted by the Bell Labs NRSO, which features a state-of-the-art conference/multimedia center. Lucent graciously provided the venue as part of its corporate outreach program aimed at supporting technical associations and non-profit organizations. The Chapter appreciates their generous hosting. EMC

Allison Black from NRSO welcomes Leo Makowski of HV Technologies to the June meeting of the Washington DC/Northern Virginia Chapter.

Bell Labs NRSO provided a state of the art meeting facility for the Washington DC/Northern Virginia Chapter.

Guillermo Warley, Greg Snyder of Washington Labs, and Tom Boughner of EMC Technologies (from left) enjoy the June meeting of the Washington DC/Northern Virginia Chapter.

Happy attendees at the Washington DC/Northern Virginia Chapter meeting.

Vic Hudson of Rohde & Schwarz presented “Improving the Accuracy of EMI Emissions Testing” at the April meeting of the Washington DC/Northern Virginia Chapter.

Dr. Vince Rodriguez of ETS-Lindgren presented “Anechoic Chamber Solutions for Antenna Pattern Measurements” at the Washington DC/Northern Virginia Chapter half day Tech Tour seminar in April.

Blaise Corbett of the Naval Surface Warfare Center explained that reverberation chambers are emerging as an alternative test facility for EM/EMC measurements during his presentation to the Washington DC/Northern Virginia Chapter.

A reception with the speakers was held following the half day April Tech Tour in Columbia, Maryland, and concluded with a few raffle drawings. Sharon Smith of Conformity Magazine presented a raffle prize to lucky Len Knight of MET Laboratories.