
The 2007 IEEE International Symposium on EMC
set an all time record in the number of papers received for the
Symposium’s technical program. The ten Technical Committees
(TCs) of the IEEE EMC Society reviewed over 300 papers! TC-2,
which addresses “EMC Measurement”, received the largest
number of papers, followed by TC-4 on “EMI Control”
and TC-9 on “Computational EMC”. The best papers will
be presented during the Symposium, which takes place at the Hawaii
Convention Center in Honolulu, Hawaii over July 8-13, 2007.
Todd Hubing of Clemson University and Don Heirman of Don HEIRMAN
Consultants are the Co-Chairs of the Symposium’s Technical
Program. Professor Hubing noted, “We were especially gratified
to not only receive a high number of papers, but also papers from
authors around the world. Approximately 30% of the paper authors
are from Asia, 31% are from the US and 39% are from Europe. This
represents a truly international program of papers for the symposium
this year.” Added Mr. Heirman, “We were also pleased
to see excellent special sessions and workshops submitted on such
important topics as Automotive EMC, Signal Integrity, EMC and
Wireless Devices, and Managing Regulatory Access to Asia Pacific
Markets, to name just a few.”
The year 2007 marks the 50th Anniversary of the EMC Society. Janet
O’Neil of ETS-Lindgren, Chair of the Symposium Steering
Committee, announced many special activities are planned to commemorate
this milestone. “The Hawaii Convention Center was selected
as the venue for this special symposium as its geographic location
will appeal to EMC engineers in Asia, which is the fastest growing
region for IEEE EMC Society membership. In addition, we’re
celebrating the 50th anniversary in the 50th state, a unique tie-in
that we’ll see just once in our lifetimes. We welcome those
interested in EMC to join us in Hawaii to hear excellent technical
papers, view a comprehensive technical exhibition, and celebrate
our 50th anniversary with us.”
The IEEE EMC Society addresses engineering related to the electromagnetic
environmental effects of systems to be compatible with itself
and their intended operating environment. This includes standards,
measurement techniques and test procedures, instrumentation, equipment
and systems characteristics, interference control techniques and
components, education, computational analysis, and spectrum management,
along with scientific, technical, industrial, professional or
other activities that contribute to this field. Each year, over
2,000 people interested in electromagnetic compatibility meet
at the Society’s annual Symposium, the premier event known
worldwide for the high quality and quantity of technical papers
on EMC. The corresponding exhibition attracts leading companies
that occupy more than 100,000 sq. ft. of convention center space.
For more information, visit www.emc2007.org.
EMC