Following are abstracts of papers from previous EMC symposia, related conferences, meetings and publications.
Bob Hunter, Consultant
r.d.hunter@ieee.com
Sha Fei, EMC Research Section, Northern Jiatong University, Beijing, China
emclab@center.njtu.edu.cn
Ferdy Mayer, L.E.A.D., Maisons, Alfort France
FerdyMayerLEADFrance@compuserve.com
Maria Sabrina Sarto, Department of Electrical Engineering, University of Rome, Italy
sarto@elettrica.ing.uniroma1.it
Osamu Fujiwara
Associate Editor
Engineering college/university libraries, public libraries, company or corporate libraries, National Technical Information Services (NTIS), or the Defense Technical Information Center (DTIC) are all possible sources for copies of abstracted articles of papers. If the library you visit does not own the source document, the librarian can probably request the material or a copy from another library through interlibrary loan, or for a small fee, order it from NTIS or DTIC. Recently it became clear that EMCABs were more timely than publications which were being listed in data files. Therefore, additional information will be included, when available, to assist in obtaining desired articles or papers. Examples are: IEEE, SAE, ISBN, and Library of Congress identification numbers.
Also, the steering staffs of the Japan Technical Group and the EMC Japan Tokyo Chapter have offered to act as a central point for requests of papers abstracted here. Most of the papers will be available in Japanese only. Abstracts of papers from EMC Japan will be clearly identified. As a member of the steering staff, I will assist in routing your request to the author(s) but will not translate the papers.
Some of the Chinese papers are not available in English. Professor Sha Fei, EMC Research Section, Northern Jiatong University, has offered his time and assistance in routing requests for papers to appropriate author(s). He is not furnishing a translation service.
As the EMC Society becomes more international, we will be adding additional worldwide abstractors who will be reviewing articles and papers in many languages. We will continue to set up these informal cooperation networks to assist members in getting the information or contacting the author(s). We are particularly interested in symposium proceedings which have not been available for review in the past. Thank you for any assistance you can give to expand the EMCS knowledge base.
EMCABS: 01-2-99
A FAMILY OF LOW EMI UNITY POWER FACTOR CONVERTERS
Marinus van der Berg and Jan A. Ferreira
Industrial Electronic Technology, Energy Laboratory,
Rand Afrikaans University, 2004 Auckland Park, South Africa, and Delft University of
Technology, 2600 GA Delft, The Netherlands
IEEE Transactions on Power Electronics, vol.13, no.3, May 1998, pp.547-555
Abstract: A new family of converter (ac-dc) circuits is presented. The family of circuits uses soft switching and high input power factor to meet both conducted EMI and harmonics requirements. Detailed analyses are supported by test results that show a conducted emissions improvement of 5-10 dB microvolt over hard switching circuits of similar type.
Index terms: ZVS resonant converters, power factor correction, harmonics reduction, conducted emissions reduction
EMCABS: 02-2-99
FREQUENCY COORDINATION BETWEEN CDMA AND NON-CDMA SYSTEMS
Samir Soliman and Charles Wheatly
QUALCOMM, Inc., San Diego, CA (USA)
Proceedings of the 1995 IEEE MTT-S Symposium on Technologies for Wireless Applications,
Vancouver, BC, Canada, February 20-23, 1995, pp. 79-87
Abstract: This paper investigates cochannel and adjacent channel interference between CDMA and non-CDMA systems. Mitigation indicates a frequency separation of at least 870 kHz will prevent non-CDMA subscriber stations from interfering with CDMA base stations. In cases where the services share the band, a guard zone with path loss of 144 dB seems to suffice. Noise Figures and Coordination are recommended for minimizing interference.
Index terms: EMC for CDMA systems, spectrum management, frequency coordination, noise figure, guard band, guard zone
EMCABS: 03-2-99
FAST EMC ANALYSIS FOR PRINTED CIRCUIT BOARDS USING AN
EQUIVALENT-WIRE METHOD OF MOMENTS
M.Leone, H.Bruns and H.Singer
Technical University Hamburg-Harbug
21079 Hamburg, Germany
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.7-12
Abstract: The EMC analysis of printed circuit boards (PCBs) with the method of moments combined with an equivalent wire model offers the advantages of small modeling effort and short computation time. Being a full-wave method, it includes all electromagnetic phenomena encountered in modern printed circuit boards, e.g. transmission line effects, reflection, and mutual trace coupling, for arbitrary complex nets. This simplifying approach which has been recently used for the prediction of radiated emissions is further investigated giving validity ranges and error estimations. An extension for the treatment of large trace widths and the accurate computation of radiated fields using appropriate Green’s functions, including vertical currents within the PCB substrate is presented. Validation by more rigorous analysis examples indicates the broad range of practical application.
Index terms: Printed circuit board, radiated emission, method of moments, analysis
EMCABS: 04-2-99
THE USE OF AN ACTIVE TEST BOARD TO VALIDATE A METHOD THAT
PREDICTS
DIFFERENTIAL MODE RADIATED EMISSIONS FROM PRINTED CIRCUIT BOARDS
Emmanuel Leroux1), Andrea Giuliano1), Garla Giachino1),
Ronald De Smed2), Jan De Moerloose2), Willem Temmerman2),
Paolo Fogliati3), Piero Belforte3) and Bernard Demoulin4)
1) High Design Technology, Corso Trapani 16, 10139 Torino, Italy,
2) Alcatel Bell Telephone, Francis Wellesplein 1, B-2018 Antwerpen, Belgium,
3) CSELT, Via Reiss Romoli 2274, 10148 Torino, Italy,
4) University of Lille, 59655 Villeneuve d’ascq, France
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.28-32
Abstract: The design of new Printed Circuit Boards (PCBs) could be conveniently supported by the use of a fast and reliable estimations tool of the Radiated Emissions (RE). In this paper an active test board is used to validate a method aimed at predicting RE due to differential mode currents on PCB traces. The method takes into account effects of dielectric layer in the field calculation and does not need to discretise traces in short segments. It can simulate all traces of a PCB in a reasonable computation time. The simulation results are compared with measurements in a semi-anechoic chamber in far field. Radiation from the routed power net, on board batteries holders is put in evidence though measurement in near field. The paper shows the importance of modeling of components and of taking into account all couplings in the measurement set-up when comparing RE results. The method validated in this paper is included in the Telecom Hardware Robustness Inspection System (THRIS) for evaluation of telecom hardware.
Index terms: Active test board, printed circuit board, radiated emission, differential mode current
EMCABS: 05-2-99
EVALUATION OF SAR AND TEMPERATURE DISTRIBUTION IN SUBJECTS
EXPOSED IN THE FAR-FIELD OF RADIATING RADIO FREQUENCY SOURCES
P.Bernardi, M.Cavagnaro, S.Pisa and E.Piuzzi, University of
Rome “La Sapienza”, Department of Electronic Engineering,
Via Eudossiana 18, 00184 Rome, Italy
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.190-193
Abstract: In this work. a subject exposed to the far field of RF broadcasting sources has been considered. The incident field has been supposed to be a plane wave of variable frequency from 20 to 900. In a previous work, we have shown that in particular situations, SAR evaluation is not sufficient to establish if a given exposure is safe from a thermal point of view. In fact, heating is strongly influenced not only by the power dissipated in a certain volume of tissue and by the way in which absorption is distributed in the volume, but also by the thermal characteristics of the tissues and the heat exchanges. For this reason in this work we have solved both the electromagnetic and the thermal problem. In particular, the FDTD method has been used for computing the electromagnetic field distribution inside the exposed body, while an explicit finite difference formulation of the Bio-Heat equation has been adopted for computing the temperature increase. Thc obtained results have shown that thermal analysis gives a more complete information on the exposure hazard than SAR analysis alone.
Index terms: RF broadcasting source, biological hazard, SAR, temperature distribution, FDTD analysis
EMCABS: 06-2-99
ASYMMETRICAL NOISE IMMUNITY FLIP-FLOP FOR THE USE OF FAIL-SAFE
COMPONENT
Tsuneo Tsukagoshi1), Shuichi Nitta2), Atsuo Mutoh2), and
Shigeru Kaneko2)
1) EMC Technical Center, NEC Corporation, 4-1-1 Miyazaki, Kawasaki, Kanagawa, 216-8555
Japan.
2) Department of Mechanical Systems Engineering, Tokyo University of Agriculture and
Technology, 2-24-16 Naka-cho, Koganei, Tokyo, 184-0012 Japan
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.219-224
Abstract: Generally, in digital circuits, it is uncertain whether its output changes to H or L for malfunction due to noise on power supply line. This makes it difficult to design the fail-safe system of a digital circuit in practical applications. In this paper, asymmetrical noise immunity Flip-Flop whose noise immunity on Vcc from H to L is different from L to H is proposed. It is shown that asymmetrical noise immunity characteristics can be intentionally realized by applying unbalanced ODF to two transistors which compose the Flip-Flop circuit. Design method to realize an asymmetrical noise immunity Flip-Flop is also shown.
Index terms: Digital circuit, flip-flop, asymmetrical noise immunity
EMCABS: 07-2-99
ASSESSMENT OF THE SHIELDING EFFECTIVENESS OF A REAL ENCLOSURE
Ronald De Smedt1), Jan De Moerloose1), Steven Criel1),
Daniel De Zutter2), Frank Olyslager2), Eric Laermans2),
Ward Wallyn2), and Norbert Lietaert3)
1) Alcatel Telecom, EMC Research, Francis Wellesplein 1, B-2018 Antwerpen, Belgium,
2) Univefslty of Gent, Department of Information Technology, St.-Pietersnieuwstraat 41,
B-9000 Gent, Belgium.
3) BARCO NV, Research & Development Department, Th. Sevenslaan 106, B-8500 Kortrijk,
Belgium
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.248-253
Abstract: We determine the shielding effectiveness (SE) of a real enclosure: a commercial, shielded 19" rack, with a complicated structure. We use simple, equivalent circuits to approximate the SE of multiple apertures and grids. To assess the SE of a complex shield, we first identify all possible points of leakage and simulate the belonging SE with the above simple and quick analysis method. By comparing and ranking the results, we are able to 1ocate the most critical parts of the shield and to determine the total SE. A good agreement with measured results is obtained.
Index terms: Shielding effectiveness, multiple apertures, equivalent circuit approximation, measurement
EMCABS: 08-2-99
TRANSIENT ANALYSIS OF THE ELECTROMAGNETIC FIELD IN SEIELDED
ENCLOSURE CONFIGURATION BY THE MIXED FD/WE-TD METHOD
F.Maradei, Department of Electrical Engineering, University of Rome “La
Sapienza”, Via Eudossiana 18, 00184 Rome, Italy
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.322-327
Abstract: The mixed finite difference/Whitney elements time domain (FD/WE-TD) method is applied to the analysis of transient electromagnetic field in complex configurations such as enclosure with aperture. The mixed FD/WE-TD method consists in discretizing the region in two parts composed respectively by structured and unstructured elements and leads to an explicit-implicit solution scheme. In the structured mesh Yee’s algorithm is applied to solve Maxwell’s curl equations while in the unstructured mesh the Whitney elements-time domain method is applied to solve the wave equation. The method is very powerful since it permits to overcome some of the main limitations of the basic FDTD method, such as staircase in modeling of curved boundaries and uniform space discretization, without a significant increase of the computational cost. The procedure is tested in canonical configurations and then applied to the analysis of the electromagnetic field in shielded enclosure with aperture configurations.
Index terms: Enclosure with aperture, transient field analysis, mixed finite-difference/Whitney elements time domain method
EMCABS: 09-2-99
MICROWAVE FIELD-TO-WIRE COUPLING MEASUREMENT
S.Silfverskiold1), M.Backstrom2) and J.Loren2)
1) National Deference College, P.O.Box 27805, S-115 93 Stockholm, Sweden
2) FOA Deference Research Establishment, P.O.Box 1165, S-581 11 Linkoping, Sweden
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.452-457
Abstract: Knowledge of antenna receiving properties of wires and cables is essential in the analysis of susceptibility of electronic systems to microwave radiation. This paper presents measurements of receiving parameters for basic wire geometries. Directional properties of realized gain, receiving cross section and of effective antenna length for the wires are presented. The impact of measured directivity effects of the order of 15 dB on radiated susceptibility testing in anechoic and mode-stirred chambers is discussed.
Index terms: Wire geometries, field-to-wire coupling measurement, radiated susceptibility testing, mode-stirred chambers
EMCABS: 10-2-99
NEW FINDING METHOD OF RADIATED EMISSION SOURCES UTILIZING CISPR
EMISSION MEASUREMENT SYSTEM
Yasuhiro Ishida1), Kazuo Murakawa2), Kouji Yamashita3)
and Masamitsu Tokuda3)
1) Fukuoka Industrial Technology Center, 3-6-1 Nortimatsu, Yahatanishi-ku, Kitakyushu-shi,
807-0831 Japan,
2) NTT Co. Ltd., 3-9-11 Midori-cho, Musashino-shi, 180-8585 Japan
3) Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata-ku, Kitakyushu-shi, 804-8550
Japan
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.500-504
Abstract: New emission sources finding method, which uses only amplitude data without phase, applying the discrete singularity method is proposed. The position estimation deviation between the estimated and the given current positions is less than 0.2m and the amplitude estimation deviation is less than 1.6 dB when spherical dipole antennas are used as ideal emission sources. Consequently, it is revealed that the finding method can be applied to find emission sources on equipment under test at CISPR emission measurement.
Index terms: CISPR emission measurement, radiated source finding, discrete singularity method
EMCABS: 11-2-99
ESD RESPONSE OF LINEAR SYSTEMS USING ONLY SCALAR CW MEASUREMENTS
G.Cerri, R.De Leo and V.Mariani Primiani
Dipartimento di Elettronica ed Automatica, Universita di Ancona, Italy
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.637-640
Abstract: The goal of this paper is to state a procedure that enables one to estimate the behavior of a linear system excited by non-sinusoidal sources (for example ESD), making use of CW measurements of its transfer function amplitude by low cost scalar instrumentation. The method, based on the synthesis of the transfer function by means of proper elementary structures, is efficient, simple and gives an upper bound of the system response in the time domain. Numerical results are validated by measurements in several cases, where the response to an ESD is recovered for coupled PCB traces and enclosures with apertures.
Index terms: ESD, linear system response, scalar CW measurement, synthesis of transfer function
EMCABS: 12-2-99
MODELING AND EXPERIMENTAL ACTIVITY ABOUT THE COUPLING OF ESD
THROUGH THE GROUNDING SYSTEM
Marco Angeli1), Ermanno Cardelli1) and Bernardo Tellini2)
1) Instituto di Energetica, Universita di Perugia, Via G. Duranti, 06125 Perugia, Italy,
2) Dipartimento di Sistemi Elettrici e Automazione, Universita di Pisa, Via Diotisalvi 2,
56126 Pisa, Italy
Proceedings of International Symposium on Electromagnetic Compatibility, Rome, Italy,
September 14-18, 1998, pp.652-657
Abstract: In this paper we report some results dealing with our investigation about the role played by the grounding system in the coupling between an electrostatic discharge (ESD) event and a possible victim component or system. This investigation has been made with two connected scientific activities. The numerical modeling and simulation of the system (ESD + grounding + victim) has been made by means of a suitable application of the Finite-Difference in Time Domain (FDTD) technique. This numerical technique has been studied in particular in order to well simulate the ESD source in complex geometries, where there are interconnection conductors that pass through the boundary of the investigated region and reach far grounding systems. The experimental activity has been carried out in order either to check the numerical procedure or to measure the interference conducted via the grounding system to possible susceptible electronic devices. The practical problems encountered and solved during this experimental activity are presented and discussed in the paper. Preliminary results applied to radial or meshed grounding systems seem to prove the effectiveness and the accuracy of the numerical modelling technique proposed. Finally, some quantitative and qualitative considerations about the level of the interference produced and of the coupling degree vs. the position of the ESD and the configuration of the grounding system are reported.
Index terms: ESD, coupling through grounding system, FDTD analysis, experiment