IEEE SENSORS 2009 Conference - 25-28 October 2009

Tutorials

Micro-Optic and
Fiber Optic Sensors

Terahertz Sensing

Noise Harvesting

Chemical and Gas
Sensing

Industrial Tomography

Silicon Piezoresistive
Stress Sensors

Miniaturised
Space Payloads

Integrated Gas Sensors

Sensors as
Communication Channels

Nanophotonic Sensors

Biopolymer Detection

Integrated
Radar Sensors

Ultrasonics

Title:	Industrial Tomography Sensing and Imaging
Speaker:	Krikor B Ozanyan - SMIEEE, The University of Manchester, UK

Abstract
Tomography has a special position in the field of sensing and imaging, as a "bolt-on" technology suitable for a variety of new and established sensing modalities. By taking a comparatively small number of measurements, strategically placed at the periphery of a subject, its cross-sectional image is reconstructed, typically with minimum intrusion. Thus, data acquired from an affordable number of identical sensors can be used to achieve image contrast in various physical parameters of interest to industry. Industrial Tomography has its peculiar requirements and challenges, such as access, speed, sensitivity to chemical species, ability to reconstruct subjects from a limited number of views, portability, low cost, etc.

This Tutorial will start with a detailed introduction into the fundamentals of Tomography, based on the classical case of X-ray Computed Tomography. The inverse problem of Tomography will be defined and examples of basic reconstruction techniques will be given. As a hands-on exercise within the Tutorial, the tutees will reconstruct e.g. the distribution of a chemical species in a reactor from a given set of simulated transmission measurements.

Further, the Tutorial will aim to translate the fundamental principles into the design and utilisation of Tomography sensing and imaging systems, with a focus on Tomography imaging scenarios for the needs of industry. Some achievements in high-energy modality systems, such as gamma-ray, x-ray, optical and THz tomography will be examined. Possibilities for multi-modality tomography will be discussed, with emphasis on imaging of multiphase industrial subjects.

Finally, some present day applications in Industrial Tomography will be addressed in the general context of sensors and sensing, ending in a short discussion on the balance between efforts to produce an image and using raw measurement data, e.g. for control purposes.

The Tutorial should be suitable for any delegate to the IEEE Sensors 2009 Conference.

Biography
Krikor Ozanyan has held academic and research posts in the UK and other European Universities after gaining an MSc degree in Engineering Physics (1980) and PhD in Solid-State Physics (1988). In the recent years he has combined his background and experience in optical ("hard-field") sensing modalities with the principles of indirect imaging. He has pioneered guided-path tomography and is pursuing research in the areas of portable instrumentation, multi-channel signal and data processing, multi-modality measurements, tomography sensing from limited views and temperature tomography. He has authored and co-authored more than 180 publications and works closely with UK industries such as British Petroleum and Rolls-Royce. In the last 10 years he has been principal or co-investigator in externally funded projects worth a total exceeding £3.6M. His latest interest is in THz Tomography imaging of temperature fields in high-pressure flames.

Krikor Ozanyan is Senior Member of IEEE, Fellow of the Institute of Physics (UK) and member of its Optics Group Committee, as well as Fellow of the Institute of Engineering and Technology, formerly IEE (UK). He is Associate Editor and Member of the Editorial Board of IEEE Sensors J. and was the Lead Guest Editor of the Journal's Special Issue "Sensors for Industrial Process Tomography". He has been involved in industrial and academic training on Process Tomography through the Virtual Centre of Industrial Process Tomography (UK) in 2000, 2003 and 2007 and has been consultant to European companies. Krikor Ozanyan is currently appointed as IEEE Sensors Council Distinguished Lecturer and in the first year of his term was invited for more than 10 Distinguished Lectures across Europe, Japan and China, on various aspects of Tomography sensing and imaging.