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ICITA
2004
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IEEE
Orlando Section
ED/CPMT
(Electron Devices / Components, Packaging,
and Manufacturing Technology)
Meeting
Announcement
Unless otherwise stated,
non-IEEE members are welcome to attend the meetings
listed here. Members are encouraged to invite and
bring guests to these
events.
IEEE
Distinguished Lecture
Electrostatic Discharge (ESD) Protection Structures
in Microchips
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Date:
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Wednesday,
September 3, 2003
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Time:
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TBA
(2:00 PM tentative)
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Pace:
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Room
232, Computer Science Building,
UCF
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Speaker:
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Juin
J. Liou, University of Central
Florida
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Contact:
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Anwar Sadat, anwarsadat@ieee.org
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Abstract:
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- Electrostatic discharge (ESD) is a process
in which a finite amount of charge is
transferred from one object (i.e., human body)
to the other (i.e., micro-chip). This process
can result in a very high current passing
through the microchip within a very short period
of time, and more than 35% of chip damages can
be attributed to such an event. An overview on
the ESD and ESD protection techniques will first
be given. This is followed by the development of
a compact yet accurate MOS model suitable for
SPICE circuit simulation under the ESD event.
Finally, the design and optimization of ESD
protection structures for radio frequency (RF)
applications will be addressed.
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Bio:
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- Juin J. Liou received the B.S. (honors),
M.S., and Ph.D. degrees in electrical
engineering from the University of Florida,
Gainesville, in 1982, 1983, and 1987,
respectively. In 1987, he joined the Department
of Electrical and Computer Engineering at the
University of Central Florida, Orlando, where he
is now a Professor. His current research
interests are semiconductor device modeling,
simulation, reliability, and characterization.
Dr. Liou has published six textbooks (another in
preparation), more than 180 journal papers
(including 12 invited articles), and more than
130 papers (including 35 keynote or invited
papers) in international and national conference
proceedings. He has been awarded more than $4.5
million of research grants from federal agencies
(i.e., NSF DARPA, Navy, Air Force, Army, NIST),
state government, and industry (i.e.,
Semiconductor Research Corp., Intel Corp.,
Intersil Corp., Lucent Technologies, Texas
Instruments, and Lockheed Martin), and has held
consulting positions with research laboratories
and companies in the United States, Japan,
Taiwan, and Singapore. In addition, Dr. Liou
serves as a technical reviewer for various
journals and publishers, as well as a chair or
member of the technical program committee for
several international conferences. Currently,
he is an associate editor for the Simulation
Journal in the area of VLSI and circuit
simulation, and a regional editor (in USA,
Canada and South America) for the
Microelectronics Reliability, an international
journal published by Elsevier Science Publisher.
Dr. Liou received eight different awards on
excellence in teaching and research from the
University of Central Florida and four different
awards from the IEEE Electron Device Society.
In the summer of 1992, 1993, and 1994, Dr. Liou
was selected as an Air Force Summer Research
Fellow at the Air Force Research Laboratory,
Dayton, Ohio, where he conducted research on
modeling and reliability of AlGaAs/GaAs
heterojunction bipolar transistors. In the Fall
of 1997, Dr. Liou took a sabbatical leave and
was a Visiting Professor in the Electrical
Engineering Dept. at National University of
Singapore, Singapore. Dr. Liou is an IEEE EDS
Distinguished Lecturer, an IEEE EDS
Administrative Committee member, an IEEE
Educational Activities Committee member, a
senior member of the IEEE, and a courtesy
professor of Huazhong University of Science and
Technology, China.
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