The CD Proceedings will be published with ISBN: 978-1-7281-9341-0
The presented papers at the conference venue will be sent to IEEE for uploading in IEEE Xplore Digital Library
with ISBN 978-1-7281-9342-7(*).
* Please note : "IEEE reserves the right to exclude a submission from distribution after the conference, including exclusion from IEEE Xplore, if the submission does not meet IEEE standards for scope and or quality."
CMI 2021-Virtual will be the second flagship event of IEEE Joint CSS-IMS Chapter, Kolkata Section, India. This event will provide a global forum for academicians, researchers, industrial practitioners, scientists and engineers to discuss about their research endeavours, studies, findings, new ideas and concepts, contributions and developments related to the areas of control theories and applications, measurement theories and applications and instrumentation theories and applications. CMI 2021-Virtual will comprise keynote and plenary sessions by eminent academicians. All papers will undergo a single blind peer review process and the criteria for acceptance will be based on quality, originality, technical content and relevance. All accepted papers presented at the conference will be submitted for publication in IEEEXplore Digital Library and will be published in the conference proceedings with an IEEE Catalog and ISBN number. Authors are invited to submit their papers not exceeding 6 pages in IEEE format.
General Chair
Rajarshi Gupta, University of Calcutta.
General Co-Chairs
Anindita Sengupta, IIEST, Shibpur.
Madhubanti Maitra, Jadavpur University.
Technical Program Chair
Kaushik Das Sharma, University of Calcutta.
Publication Chairs
Nirmal Murmu, University of Calcutta.
Members
Original Research work, neither published, not under consideration at any venue are solicited under the Control, Measurement and Instrumentation -
CMI 2021 - Brochure Click here to submit paper at CMI2021
Category (authors) | Indian (INR) | Others (USD) |
---|---|---|
IEEE/ IMS member: faculty/ industry | 6000 | 200 |
Non-member: faculty/ industry | 6500 | 225 |
IEEE student member | 4500 | 50 |
Student (non-IEEE member) | 5000 | 75 |
Non-authors | 3000 | 40 |
Bank details for transfer of author registration fees of 2021 IEEE Second International Conference on Control, Measurement and Instrumentation (CMI) - Virtual, January 8-10, 2021, Kolkata, India.
1. Title of Talk: LSI Testing: A Core Technology to a Successful Semiconductor Industry
Speaker Bio: Xiaoqing WEN received a B.E. degree from Tsinghua University, China, in 1986, a M.E. degree from Hiroshima University, Japan, in 1990, and a Ph.D. degree from Osaka University, Japan, in 1993. He was an Assistant Professor with Akita University, Japan, frrom 1993 to 1997, and a Visiting Researcher with the University of Wisconsin-Madison, USA, from Oct. 1995 to Mar. 1996. He joined SynTest Technologies Inc., USA, in 1998, and served as its Vice President and Chief Technology Officer until 2003. He joined Kyushu Institute of Technology, Japan, in 2003, where he is currently a Professor of the Department of Computer Science and Networks. He founded Dependable Integarted Systems Research Center at Kyushu Institute of Technology in 2013 and served as its Director until 2015. He is a Co-Founder and Co-Chair of Technical Activity Committee on Power-Aware Testing under Test Technology Technical Council (TTTC) of IEEE Computer Society. He is an Associate Editor for IEEE Transactions on Very Large Scale Integration Systems (TVLSI) and Journal of Electronic Testing: Theory and Applications (JETTA). He co-authored and co-edited two popular books, VLSI Test Principles and Architectures: Design for Testability (2006) and Power-Aware Testing and Test Strategies for Low Power Devices (2009). His research interests include design, test, and diagnosis of VLSI circuits. He holds 43 U.S. Patents and 14 Japan Patents. He received the 2008 Society Best Paper Award from the Infromation Systmes Society (ISS) of the Institute of Electronics, Information and Communication Engineers (IEICE). He is a Fellow of IEEE for his pionerring work in low capture power test generation, a Senior Member of Information Processing Society of Japan (IPSJ), and a Senior Member of IEICE.
2. Title of Talk: Optimization-based Formal Synthesis of Control Strategies for Dynamical Systems
Speaker Bio: Calin Belta is a Professor in the Department of Mechanical Engineering at Boston University, where he holds the Tegan Family Distinguished Faculty Fellowship. He is the Director of the BU Robotics Lab and of the Center for Autonomous and Robotic Systems (CARS), and is also affiliated with the Department of Electrical and Computer Engineering and the Division of Systems Engineering at Boston University. His research focuses on dynamics and control theory, with particular emphasis on hybrid and cyber-physical systems, formal synthesis and verification, and robotics. Notable awards include the 2005
NSF CAREER Award, the 2008 AFOSR Young Investigator Award, and the
2017 IEEE TCNS Outstanding Paper Award. He is an IEEE Fellow and a distinguished lecturer of the IEEE Control System Society.
3. Title of Talk: Recent advances in non-intrusive sensing based on magnetically or capacitively coupled schemes and related applications
Speaker Bio: Boby George received the M. Tech. and Ph. D. degrees in Electrical Engineering from the Indian Institute of Technology (IIT) Madras, Chennai, India, in 2003 and 2007, respectively. He was a Postdoctoral Fellow with the Institute of Electrical Measurement and Measurement Signal Processing, Technical University of Graz, Graz, Austria from 2007 to 2010.
He joined the faculty of the Department of Electrical Engineering, IIT Madras in 2010. Currently, where he is working as a Professor. His areas of interest include magnetic and electric field-based sensing approaches, sensor interface circuits/signal conditioning circuits, sensors and instrumentation for automotive and industrial applications. He has co-authored more than 70 IEEE transactions/journals. He is an Associate Editor for IEEE Sensors Journal, IEEE Transactions on Industrial Electronics, and IEEE Transactions on Instrumentation and Measurement.