2021 IEEE Second International Conference on Control, Measurement and Instrumentation - Virtual

January 8-10, 2021, Kolkata, India

Organized by : IEEE Joint CSS-IMS Kolkata Chapter

In collaboration with: Department of Applied Physics, University of Calcutta, India

Technical Co-sponsor: IEEE Instrumentation & Measurement Society

IEEE Conference Record Number: 50323

The CD Proceedings will be published with ISBN: 978-1-7281-9341-0
The presented papers at the conference venue will be sent to IEEE for uploading in IEEE Xplore Digital Library
with ISBN 978-1-7281-9342-7(*).

* Please note : "IEEE reserves the right to exclude a submission from distribution after the conference, including exclusion from IEEE Xplore, if the submission does not meet IEEE standards for scope and or quality."

Presentation file to be uploaded in CMT by December 31, 2020

Program Layout of CMI 2021

Presentation video file preparation guidelines

Final list of registered authors

Final List of Accepted Papers in CMI2021

Instructions for Camera Ready manuscript, Registration and e-Copyright transfer

List of Provisionally Accepted Papers

Instructions for Submission of Revised Manuscript

Due to the COVID-19 Pandemic situation in India, CMI2021 will be organised in full virtual mode. The registered authors can present their papers online, and attend all online sessions including plenary and invited lectures.


CMI 2021-Virtual will be the second flagship event of IEEE Joint CSS-IMS Chapter, Kolkata Section, India. This event will provide a global forum for academicians, researchers, industrial practitioners, scientists and engineers to discuss about their research endeavours, studies, findings, new ideas and concepts, contributions and developments related to the areas of control theories and applications, measurement theories and applications and instrumentation theories and applications. CMI 2021-Virtual will comprise keynote and plenary sessions by eminent academicians. All papers will undergo a single blind peer review process and the criteria for acceptance will be based on quality, originality, technical content and relevance. All accepted papers presented at the conference will be submitted for publication in IEEEXplore Digital Library and will be published in the conference proceedings with an IEEE Catalog and ISBN number. Authors are invited to submit their papers not exceeding 6 pages in IEEE format.

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International Advisory Committee:

  • J. Max Cortner, Jr. Past President, IMS
  • Ruth Dyer, Sr. Past President, IMS
  • Alessandro Ferrero, EiC (immd. past), TIM
  • Shervin Shirmohammadi, EiC, TIM
  • Ruqiang Yan, Assoc. EiC, TIM
  • Gaurab Sen Gupta, VP Conferences, IMS
  • V. Jagadeesh Kumar, Associate Editor, TIM
  • Anirban Mukherjee, Associate Editor, TIM
  • Boby George, Associate Editor, TIM
  • Bruno Ando, EiC, I&M Magazine
  • V R Singh, Associate Editor, TIM
  • Mihaela Albu, IMS Distinguished Lecturer
  • Luca De Vito, IMS Chapter Chair Liaison
  • Wuqiang Yang, Associate Editor, TIM
  • Subhas Mukhopadhyay, Macquarie University, Australia
  • Tarikul Islam, Associate Editor, TIM
  • Kristen Donnell, IMS DLP Chair
  • Patrick Siarry, University Paris-Est Creteil Val de Marne, France
  • Siddhartha Mukhopadhyay, IIT Kharagpur, India
  • Yacine Amirat, UPEC, France

Organizing Committee:

General Chair
Rajarshi Gupta, University of Calcutta.

General Co-Chairs
Anindita Sengupta, IIEST, Shibpur.
Madhubanti Maitra, Jadavpur University.

Technical Program Chair
Kaushik Das Sharma, University of Calcutta.

Publication Chairs
Nirmal Murmu, University of Calcutta.


  • Jitendra Nath Bera, University of Calcutta.
  • Debangshu Dey, Jadavpur University.
  • Nandita Sanyal, BPPIMT, Kolkata.
  • Jayanta K. Chandra, Purila Govt. Engg College, India.
  • Joyanta Kr. Roy, ESRF India.
  • Gautam Sarkar, Jadavpur University.
  • Biswajit Bhattacharyya, Jadavpur University.
  • Ujjwal Mondal, University of Calcutta.
  • Amitava Biswas, University of Calcutta.
  • Munmum Khanra, NIT Silchar.
  • Palash Kundu, Jadavpur University.

National Advisory Committee:

  • Deepak Mathur, IEEE Region 10
  • Vikram M. Gadre, IIT Bombay, India
  • Sugata Munshi, Jadavpur University.
  • Debatosh Guha, University of Calcutta.
  • Abhirup Das Barman, University of Calcutta.
  • Sushmita Mitra, Indian Statistical Institute.
  • Sivaji Chakraborti, NIT Calicut, IEEE India Council.
  • Samarjit Sengupta, University of Calcutta, IIEST Shibpur.
  • Amlan Chakrabarti, University of Calcutta.
  • SM Sameer, IEEE Kerala.
  • Prasid Shyam, IIEST, Shibpur.
  • Ashoke Sutradhar, IIEST, Shibur.
  • Dipankar Sanyal, Jadavpur University.
  • Subhasish Bhaumik, IIEST Shibpur.
  • Sanjay Kar Chowdhury, IEEE Kolkata Section.
  • Sujit K.Biswas, IEEE India Council.

Technical Program Committee:

  • Edoardo Fiorucci, University of L'Aquila, Italy
  • Hemanshu Pota, The University of New South Wales, Australia
  • Franjo Cecelja, University of Surrey, UK
  • Fouad Giri, University of Caen Basse-Normandie, France
  • Andrzej Bartoszewicz, Technical University of Lodz, Poland
  • Prabir Barooah, University of Florida, USA
  • Om P. Malik, University of Calgary, Canada
  • Valentina E. Balas, AurelVlaicu University of Urad, Romania
  • Hamid Rea Karimi, Politecnico di Milano, Italy
  • Radu-Emil Precup, Politehnica University of Timisoara, Romania
  • Nariman Sepehri, University of Manitoba, Canada
  • Malek Ghanes, Centrale Nantes (CN), France
  • Vedran Bilas, University of Zagreb, Croatia
  • Nikhil Chopra, University of Maryland, USA
  • Antonio Sala, UniversitatPolitecnica de Valencia (UPV), Spain
  • Samer Mohammed, University of Paris-Est Creteil, France
  • Alberto Carini, University of Trieste, Italy
  • Nithin V George, Indian Institute of Technology, Gandhinagar, India
  • Shubhajit Roy Chowdhury, Indian Institute of Technology, Mandi, India
  • Anirban Mukherjee, Indian Institute of Technology, Kharagpur, India
  • Tirthadip Ghose, Birla Institute of Technology, Ranchi, India
  • Rajib Bandyopadhyay, Jadavpur University, Kolkata, India
  • Edward T.-H. Chu, National Yunlin University of Science and Technology, Taiwan
  • Madhusree Kundu, National Institute of Technology, Rourkela, India
  • Dusmanta Kumar Mahanta, Birla Institute of Technology, Ranchi, India
  • Pradip Sircar, Indian Institute of Technology, Kanpur, India
  • C S Anoop, Indian Institute of Space Science and Technology, India
  • Olive Ray, Indian Institute of Technology, Bhubaneshwar, India
  • Soumya Subhra Nag, Indian Institute of Technology, Delhi, India
  • Akhilesh Swarup, National Institute of Technology, Rourkela, India
  • Dwaipayan Biswas, IMEC, Belgium
  • Somnath Pan, IIT (Indian School of Mines, Dhanbad), India
  • Tandra Pal, National Institute of Technology, Durgapur, India
  • Rajesh Kumar Tripathy, BITS Pilani, India
  • Murali Mohan Basukonda, Indian Institute of Technology, Kharagpur, India
  • Sourav Kumar Mukhopadhyay, Ryerson University, Canada
  • Koushik Maharatna, University of Southampton, UK
  • Nirupama Mandal, IIT (Indian School of Mines, Dhanbad), India
  • Debasattam Pal, Indian Institute of Technology, Bombay, India
  • Sohom Chakrabarty, Indian Institute of Technology, Roorkee, India
  • Surajit Panja, Indian Institute of Information Technology, Guwahati, India
  • Rusha Patra, Indian Institute of Information Technology, Guwahati, India
  • Sougata Kumar Kar, National Institute of Technology, Rourkela, India
  • Mohammed Imamul Hassan Bhuiyan, Bangladesh University of Engineering & Technology, Bangladesh
  • Sohel Rahman, Bangladesh University of Engineering & Technology, Bangladesh
  • Sibsambhu Kar, Wipro Limited, India
  • Aritro Dey, National Institute of Technology, Durgapur, India
  • Abraham T Mathew, National Institute of Technology, Calicut, India
  • Paul Joseph K, National Institute of Technology, Calicut, India
  • M. P. R. Prasad, National Institute of Technology, Kurukshetra, India
  • Soumya Maity, Dell Technologies, India
  • Paramita Guha, CSIO-Chandigarh, India
  • Subhojit Ghosh, National Institute of Technology, Raipur, India
  • Shubhobrata Rudra, National Institute of Technology, Rourkela, India
  • Bidyadhar Subudhi, Indian Institute of Technology, Goa, India
  • Anjan Kumar Ray, National Institute of Technology, Sikkim, India
  • Sourav Patra, Indian Institute of Technology, Kharagpur, India
  • Mashuq-un-Nabi, Indian Institute of Technology, Delhi, India
  • Bharat Bhushan, National Institute of Technology, Hamirpur, India
  • Saptarshi Das, University of Exeter, UK
  • Sreeraman Rajan, Carleton University, Canada
  • Srinivasan Krishnaswamy, Indian Institute of Technology, Guwahati, India
  • Ahmad Ali, Indian Institute of Technology, Patna, India
  • Babji Srinivasan, Indian Institute of Technology, Gandhinagar, India
  • S. Sathiya, National Institute of Technology, Jalandhar, India
  • Arnab Dey, Indian Institute of Technology, Roorkee, India
  • Chirasree Roy Chaudhuri,IIEST, Shibpur, India
  • Rajani Kanta Mudi, Jadavpur University
  • Runu Banerjee Roy, Jadavpur University
  • Kumardeb Banerjee, Jadavpur University
  • Ranjit K Barai, Jadavpur University
  • Sarbani Roy, Jadavpur University
  • Sayantan Chakraborty, Jadavpur University
  • Nibaran Das, Jadavpur University
  • Pratyusha Rakshit, Jadavpur University
  • Anjan Kundu, University of Calcutta
  • Nabendu Chaki, University of Calcutta
  • Soumya Sen, University of Calcutta
  • Soumya Pandit, University of Calcutta
  • Anupam Karmakar, University of Calcutta
  • Sanatan Chattopadhyay, University of Calcutta
  • Kanik Palodhi, University of Calcutta
  • Anirban Bhattacharyya, University of Calcutta
  • Sourav Ghosh, University of Calcutta
  • Sunirmal Khatua, University of Calcutta
  • Pritha Banerjee, University of Calcutta
  • Poulomi Gupta, University of Calcutta, India
  • Koushik Dutta, Netaji Subhas Engineering College, Kolkata, India
  • Samik Marick, Future Institute of Engineering and Management, Kolkata, India
  • Sujoy Biswas, NITMAS, Kolkata, India
  • Umesh C Pati, NIT Rourkela, India

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Call for Paper:

Original Research work, neither published, not under consideration at any venue are solicited under the Control, Measurement and Instrumentation -

  • Advances in Theoretical Aspects of Control, Measurement & Instrumentation (CMI)
  • Adaptive & Intelligent Control
  • Nonlinear Systems & Control
  • Process Control & Instrumentation
  • Networked & Distributed Control
  • Optimal & Robust Control
  • Estimation, Modeling & Identification
  • Real time Systems & Embedded Applications in CMI
  • Multi Agent Systems
  • Agricultural Application of CMI
  • Smart City and Vehicular Applications of CMI
  • Sensors& Sensor data fusion
  • Robotics & Mechatronics Systems
  • Signal & Image Processing in CMI
  • Vision Sensing Based Systems
  • VLSI, Micro & Nanotechnology in CMI
  • Biomedical Sensors, Signal Analysis & Health Monitoring Applications
  • CMI in Wireless Systems
  • IoT Applications in CMI
  • Systems & Synthetic Biology
  • Machine Learning & AI Applications in CMI
  • CMI in Smart Power Systems

CMI 2021 - Brochure Click here to submit paper at CMI2021

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Registration Form

Category (authors) Indian (INR) Others (USD)
IEEE/ IMS member: faculty/ industry 6000 200
Non-member: faculty/ industry 6500 225
IEEE student member 4500 50
Student (non-IEEE member) 5000 75
Non-authors 3000 40

Bank details for transfer of author registration fees of 2021 IEEE Second International Conference on Control, Measurement and Instrumentation (CMI) - Virtual, January 8-10, 2021, Kolkata, India.

Bank: Corporation Bank
Branch: Kolkata Jadhavpur (PBB Branch Code: 000595)
Address: 46/3A, Jadavpur Central Road, Ground Floor, Kolkata, West Bengal, PIN 700032, India
Account No. : 520101245915512
Type: Savings Bank
Account name: IEEE Kolkata Section
MICR Code: 700017009
IFSC code: CORP0000595

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Important Dates:

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General Instructions for Paper Submission:

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Keynote and Plenary Speakers:

1. Title of Talk: LSI Testing: A Core Technology to a Successful Semiconductor Industry

  • Xiaoqing WEN, Professor, Department of Computer Science and Networks, Kyushu Institute of Technology, Japan.
Abstract: The semiconductor industry is exposed to shrinking feature sizes, growing circuit complexity, increasing clock speeds, and decreasing power supply voltages. In addition to significant impact on LSI design and manufacturing, these factors also have a profound impact on LSI testing, a complex process for separating defective chips from defect-free ones. The major challenges to LSI testing are low test quality, high test cost, and excessive test power. These challenges have led to new chances of innovations in LSI testing, characterized by cell-aware test generation, test compression, and power-aware testing. This talk will review these challenges and chances. Furthermore, this talk will reveal the role of LSI testing in the semiconductor business chain, so as to explain why LSI testing is a core technology to a successful semiconductor industry.

Speaker Bio: Xiaoqing WEN received a B.E. degree from Tsinghua University, China, in 1986, a M.E. degree from Hiroshima University, Japan, in 1990, and a Ph.D. degree from Osaka University, Japan, in 1993. He was an Assistant Professor with Akita University, Japan, frrom 1993 to 1997, and a Visiting Researcher with the University of Wisconsin-Madison, USA, from Oct. 1995 to Mar. 1996. He joined SynTest Technologies Inc., USA, in 1998, and served as its Vice President and Chief Technology Officer until 2003. He joined Kyushu Institute of Technology, Japan, in 2003, where he is currently a Professor of the Department of Computer Science and Networks. He founded Dependable Integarted Systems Research Center at Kyushu Institute of Technology in 2013 and served as its Director until 2015. He is a Co-Founder and Co-Chair of Technical Activity Committee on Power-Aware Testing under Test Technology Technical Council (TTTC) of IEEE Computer Society. He is an Associate Editor for IEEE Transactions on Very Large Scale Integration Systems (TVLSI) and Journal of Electronic Testing: Theory and Applications (JETTA). He co-authored and co-edited two popular books, VLSI Test Principles and Architectures: Design for Testability (2006) and Power-Aware Testing and Test Strategies for Low Power Devices (2009). His research interests include design, test, and diagnosis of VLSI circuits. He holds 43 U.S. Patents and 14 Japan Patents. He received the 2008 Society Best Paper Award from the Infromation Systmes Society (ISS) of the Institute of Electronics, Information and Communication Engineers (IEICE). He is a Fellow of IEEE for his pionerring work in low capture power test generation, a Senior Member of Information Processing Society of Japan (IPSJ), and a Senior Member of IEICE.

2. Title of Talk: Optimization-based Formal Synthesis of Control Strategies for Dynamical Systems

  • Calin Belta, Professor, Department of Mechanical Engineering, Boston University, USA.
Abstract: In control theory, complicated dynamics such as systems of (nonlinear)differential equations are mostly controlled to achieve stability. This fundamental property is often linked with optimality,which requires minimization of a certain cost along the trajectories of astable system. In formal synthesis, simple systemssuch as finite state transition graphs modeling computer programs ordigital circuits are controlled from specifications such as safety, liveness, or richer requirements expressed as formulas of temporal logics. With the development and integration of cyber physical and safety critical systems, there is an increasing need for computational tools for controlling complex systems from rich, temporal logic specifications. In this talk, I will introduce some recent results on the connection between optimal control and formalsynthesis. Specifically, I will focus on the following problem: given a costand a correctness temporal logic specification for a dynamical system,generate an optimal control strategy that satisfies the specification. I will first briefly review automata-based methods, in which thedynamics of the system are mapped to a finite abstraction that is then controlled using an automaton corresponding to the specification. I will then focus on optimization-based methods, which rely onmapping the specification and the dynamics to constraints of an optimizationproblem. I will illustrate the usefulness of these approaches with examples from robotics and traffic control.

Speaker Bio: Calin Belta is a Professor in the Department of Mechanical Engineering at Boston University, where he holds the Tegan Family Distinguished Faculty Fellowship. He is the Director of the BU Robotics Lab and of the Center for Autonomous and Robotic Systems (CARS), and is also affiliated with the Department of Electrical and Computer Engineering and the Division of Systems Engineering at Boston University. His research focuses on dynamics and control theory, with particular emphasis on hybrid and cyber-physical systems, formal synthesis and verification, and robotics. Notable awards include the 2005
NSF CAREER Award, the 2008 AFOSR Young Investigator Award, and the
2017 IEEE TCNS Outstanding Paper Award. He is an IEEE Fellow and a distinguished lecturer of the IEEE Control System Society.

3. Title of Talk: Recent advances in non-intrusive sensing based on magnetically or capacitively coupled schemes and related applications

  • Boby George, Professor, Department of Electrical Engineering, Indian Institute of Technology, Madras.
Abstract: With the recent advancements in sensor signal processing, material science, technology, and manufacturing, we are in a position to extend and utilize some of the well-known concepts such as magnetic and capacitive coupling, in an efficient way, to design novel non-intrusive measurement systems. Such systems can offer non-intrusive solutions for measurement problems by reliably accessing the sensing point through the coupling mechanisms, with either no changes or minimal ones to the existing infrastructure. As these are contactless measurement systems, the reliability is very high, by design, and there are fewer maintenance problems, leading to the development of lost cost sensors with a long life-span. Some of the simple, but interesting designs, reported recently along these lines, will be discussed keeping the desired application in focus. The applications of non-intrusive sensors, that will be briefly discussed, include sensors for intelligent transportation, sensors to improve the efficiency of wireless charging, health-monitoring sensors for hydraulic systems, and sensors to monitor water quality and quantity.

Speaker Bio: Boby George received the M. Tech. and Ph. D. degrees in Electrical Engineering from the Indian Institute of Technology (IIT) Madras, Chennai, India, in 2003 and 2007, respectively. He was a Postdoctoral Fellow with the Institute of Electrical Measurement and Measurement Signal Processing, Technical University of Graz, Graz, Austria from 2007 to 2010.
He joined the faculty of the Department of Electrical Engineering, IIT Madras in 2010. Currently, where he is working as a Professor. His areas of interest include magnetic and electric field-based sensing approaches, sensor interface circuits/signal conditioning circuits, sensors and instrumentation for automotive and industrial applications. He has co-authored more than 70 IEEE transactions/journals. He is an Associate Editor for IEEE Sensors Journal, IEEE Transactions on Industrial Electronics, and IEEE Transactions on Instrumentation and Measurement.

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Tourist and Travel Information of Kolkata, India:

Getting to Kolkata

Kolkata also known as Calcutta (the official name until 2001) is the "cultural capital" of India and the capital of India until 1911 and now the capital of the Indian state of West Bengal. It is the third-most populous metropolitan area in India. The Port of Kolkata is India's oldest operating port and its sole major riverine port. The city, nicknamed the "City of Joy" is widely regarded for its educational and cultural heritage and six Nobel Laureates have been associated with the city.

For more details: https://www.wbtourismgov.in/

Kolkata Airport, named as Netaji Subhas Chandra Bose International Airport, is located some 16 km (9.9 mi) north-east of the city center, operates domestic and international flights. The airport is a major center for flights to Northeast India, Bangladesh, Bhutan, China and Southeast Asia. In 2014 and 2015, Kolkata Airport won the title of Best Improved Airport in the Asia-Pacific region awarded by the Airport Council International.

The ways to reach the Venue from airport
Kolkata Airport is situated about 12 km from the Technology Campus of University of Calcutta, Salt Lake City in Kolkata. Approximate travel time from Kolkata Airport to venue / nearby hotels is about 40 minutes. Please allow extra time during rush hour, inclement weather and special events.


Kolkata is subject to a tropical wet-and-dry climate. The annual mean temperature is 26.8 C (80.2 F); monthly mean temperatures are 19-30 C (66-86 F).January, the coldest month, has temperatures varying from 12-23 C (54-73 F). The conference timing i.e. the winter is mild and very comfortable weather pertains over the city throughout this season.


The Indian rupee (currency code: INR) is the official currency of India. The rupee is subdivided into 100 paise (singular: paisa), though as of 2019, coins of denomination of 1 rupee is the lowest value in use. The issuance of the currency is controlled by the Reserve Bank of India.You can exchange money at authorized money exchange points at Kolkata Airport and many other money exchange points around Kolkata. The majority of establishments and ATMs will also accept credit cards such as Visa, MasterCard, American Express and Diners, etc.


India is a vast and demographically varied country. There are 22 official languages of India. The people of Kolkata speaks in official languageBengali, sixth most spoken language in the world. The majority of habitants speak at least one other language like Hindi and English, therefor the English is widely spoken in Kolkata.

Time zone

Time zone in Kolkata, West Bengal is GMT+5:30.


In India the power sockets are of type C and D. The standard voltage is 230 V and the standard frequency is 50 Hz.

Visitors from Abroad

International Travel Information

IEEE CMI2021 welcomes visitors from around the world. We have compiled a list of resources to help make your travel and show experience as convenient and successful as possible.

Specific travel requirements for traveling to India can be found at the Bureau of Immigration, Ministry of Home Affairs website.

For more information: https://indianvisaonline.gov.in/


Letter of Invitation

A letter of invitation is provided only after you have completed registration for the conference and paid the conference registration fee. Such a letter may be needed to obtain a visa or permission to attend the meeting. If you require an invitation letter please contact the conference organizers via email: cmi2021india@gmail.com. The letter will be provided by email.

The Conference cannot contact or intervene with any Embassy or Consulate office abroad on your behalf so please begin your visa application process as soon as you determine that you wish to attend IEEE CMI2021. Please provide as much information as possible to avoid delays in receiving your letter. You must register for the conference and pay in full before requesting an invitation letter.

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Contact Us:

For detailed information visit URL: https://ewh.ieee.org/r10/calcutta/css_ims/index.html
Contact us: cmi2021india@gmail.com

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